Shenzhen Duoyi Electronics Co DY294 free download

File name DY294_V3.pdf

6. Testing methods for other components: a. The testing method for operating voltage drop of controlled silicon is the same as that for saturation voltage drop of common transistor in Vce (sat) step. The transistor with low voltage drop has low internal impedance and high output power. The testing method for operating current of controlled silicon is the same as that for transistor hFE step. The level of trigger current should be noted when testing controlled silicon. Insert A pole into C jack, G pole into B jack and K pole into E jack. b. Identify the output power level of transistor , controlled silicon and field effect transistor.Use Vce (sat) steps to test the transistor of the same model. The low saturation voltage drop indicates low internal impedance and high output power. c.To identify unidirectional controlled silicon and bidirectional controlled silicon, first use Vce (sat) or hEF steps of tester NPN to test. d.Identify damp of transistor. The V ( br ) step of the tester can test the reverse breakdown voltage of transistor with damp. Vce (sat) step can test its saturation voltage drop. No amplification value is found by testing it with all hFE steps. Note: When test damp transistor with damp: can test V(BR), Vce (sat) and Iceo values but hFE value. Table of Contents I. General Introduction... ... ... ... ... ... ... ... ... ... ...1 II. Common Features... ... ... ... ... ... ... ... ... ... ... 2 III. Technical Parameters... ... ... ... ... ... ... ... ... ... ...2 IV. Introduction to Panel Functions... ... ... ... ... ... ...3 V. Operation Instruction ... ... ... ... ... ... ... ... ... ... 3 VI. Maintenance ... ... ... ... ... ... ... ... ... ... ... ...12 VII. Accessories ... ... ... ... ... ... ... ... ... ... ... ... 13 X. Optional Accessories... ... ... ... ... ... ... ... ... ... ...13 I. General Introduction The 294 type Digital Display Transistor DC Parameter Tester developed and made by Shenzhen Duoyi Electronics Co., Ltd is mainly used for testing the DC parameters of manifold semiconductors such as diode, transistor, controlled silicon and field effect transistor. It also can be used to test the withstand voltage of capacitor, protection voltage of varistor and isolation of electrica l . Meanwhile it also can test 78 and 79 series three-terminal voltage regulator. The tester has adopted the large scale integrated circuit for analogue/digital conversion. With high sensitivity and accuracy, it adopts liquid crystal display which can be read directly. With compact structure and convenient operation, it is portable and especially suitable for inspection and screening of devices and components in electronic factories as well as application of technicians engaged in electronic work, lab staff, maintainers and radio fans. VI. Maintenance a.Please don't change the circuitry to ensure the precision of the tester. b