File information: | |
File name: | 052207_4ACS.pdf [preview 052207 4ACS] |
Size: | 168 kB |
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Mfg: | Keithley |
Model: | 052207 4ACS 🔎 |
Original: | 052207 4ACS 🔎 |
Descr: | Keithley Appnotes 052207_4ACS.pdf |
Group: | Electronics > Other |
Uploaded: | 18-10-2019 |
User: | Anonymous |
Multipart: | No multipart |
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Decompress result: | OK | |
Extracted files: | 1 | |
File name 052207_4ACS.pdf A GREAT ER M EA SU R E O F C O N F I D E N C E bring together a number of third-party soft- ware packages, speeding development time and increasing efficiency. The ACS software features five major functions; wafer descrip- tion, test setup, prober control, automation, and a summary report generator. The soft- ware lets users switch between lab use or manual operation and production or fully automatic mode with the same test plan. The ACS solution is a test plan devel- opment and execution platform centered around wafer-level device characterization and optimized for both the Keithley's Model 4200-SCS (Semiconductor Characteriza- tion System) and the Series 2600 System SourceMeter |
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