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Using SystemVue to Integrate a Flexible R&D Testbed for LTE Application Note Introduction As wireless communications evolve, the structure of wireless systems is becom- ing ever more complex. New test signals and measurements are needed to test the performance of these systems according to the quickly evolving wireless standards. Sometimes, however, the required waveforms and measurements are not available on existing hardware instruments. At such times it is valuable to have software in the test system that can generate the new waveforms and perform advanced measurements. To construct test systems that meet the requirements of new wireless standards, a number of different instruments are used. If we simply connect these instru- ments one by one and manually configure the test system, the task of getting this system to operate correctly will be difficult and time-consuming. A much more efficient approach is to integrate all the instruments and automate the system-level performance tests using a software tool. System-level performance tests usually require a golden transmitter and a golden receiver to provide test references. However, during the initial development of a new product, the product's transmitter and receiver are not yet complete. It is useful, therefore, to have a software receiver to test the new product design and early hardware. This application note describes an integrated solution for testing wireless communication systems based on the quickly evolving LTE standard. Agilent SystemVue is recommended as the core software in this test solution to integrate all test instruments, create new test waveforms, enable advanced mea- surements, and provide a software reference receiver. An integrated test system configured for LTE base station receiver measurements is used as an example. It is well known that receiver sensitivity is an important measurement for describ- ing LTE receiver performance. To test receiver sensitivity according to the latest 3GPP LTE specifications, Agilent proposes a test system using SystemVue with a built-in reference receiver and certain auto-configuration capabilities. In this con- figuration, this system can be used to test both frequency division duplex (FDD) and time division duplex (TDD) uplink receivers that are specified in LTE. Receiver performance curves for throughput vs. signal-to-noise ratio and for block-error- rate vs. signal-to-noise ratio are generated quickly, with reasonable test accuracy. Test Sys

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