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File name:an_376-1.pdf
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Model:an 376-1 🔎
Original:an 376-1 🔎
Descr: HP Publikacje an_376-1.pdf
Group:Electronics > Other
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File name an_376-1.pdf

Biasing Three-Terminal Devices for Test Application Note 376-1 A precise solution for component evaluation and sub-assembly testing... Introduction Biasing Methods Figure 1 shows a generalized three-terminal device. On this Measuring the operating Commonly, a three-terminal device, terminal 3 is a bias input characteristics of a wide variety of device test requires that two and terminal 2 is a control input. three-terminal devices can be parameters (voltage or current) be Terminal 1 is the common return accomplished with a single test defined as fixed, and applied to for both dc sources as shown in configuration eliminating the need the device. The other parameters Figure 2. to rewire or change are then measured. There are instrumentation. This reduction in many methods of accomplishing In the case of a bipolar transistor set-up time is especially valuable this. As each method is described, connected in the common emitter in environments where many the benefits and drawbacks will configuration, terminal 3 is the different types of components be enumerated, then the following collector, terminal 1 is the emitter, need to be evaluated, such as method will address the and terminal 2 is the base. The failure analysis labs, R&D, and drawbacks of the previous one. control variable could either be incoming inspection. the current into pin 2, or the voltage from pin 1 to pin 2. If beta The types of tests which can be is of interest, it would be simplest accomplished using the biasing to control current, and if Gm is of methods discussed below include, interest, then the choice would be but are not limited to; measuring voltage control. AC ground could ac characteristics and dc be any of t

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