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This paper was first presented at the National Conference of Standards Laboratories `97, Atlanta, Georgia, USA, on July 28,
`97.

Getting the Best out of Long Scale DMMs
in Metrology Applications

Peter B. Crisp
Wavetek Ltd

Introduction

Long-scale multifunction DMMs now have the accuracy, resolution and stability to be
used in a wide range of metrology applications. This paper describes how one such DMM can be
used as an alternative to traditional equipment such as Null Detectors, Kelvin-Varley dividers, and
Resistance Bridges. Practical examples are provided, together with a discussion of the
precautions that need to be taken to ensure optimum performance, the uncertainties that can be
achieved and the relative ease of use compared with traditional methods.

DMM Technology

For the purposes of this paper, a long scale DMM is defined as having an available
resolution of up to 8