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Keysight Technologies
High Resolution Imaging
with Keysight 7500 AFM

Application Brief

Introduction
Atomic force microscopy (AFM) was developed as a high resolution
surface imaging technique, capable of imaging and probing mate-
rial structures at the atomic or molecular level. The capability of
obtaining high resolution images with ease on different materials,
using various imaging methods such as contact and AC mode, has
become expected for high performance scanning probe micros-
copy (SPM) systems. On the other hand, the multitude of SPM ap-
plications have also become more demanding in accurate position-
ing and correct dimensional measurement. Consequently, a large
range scanner (greater than 90