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Keysight Technologies
Impedance and Network Analysis
Catalog
Introduction
You face increasing technical and operational complexity. Keysight Technologies, Inc. measurement
and application expertise helps you anticipate these growing complexities.
Keysight impedance analyzers, LCR meters and ENA series network analyzers support various
applications for impedance and network analysis. This catalog provides the information of unique and
new solutions that we cannot tell all in product brochures. Please ind the solution that its your case
or helps your similar test challenge in this catalog, and contact Keysight to accelerate your business.
Table of Contents
Circuit measurement
DC-DC converter and Power Distribution Network (PDN) measurements............................................4
PSRR in Linear Regulator/Low Dropout (LDO) Regulator........................................................................5
OP amp circuit measurements...................................................................................................................6
RFID tag measurements..............................................................................................................................7
Wireless power transmission measurement and simulation....................................................................8
In-circuit impedance measurements (grounded measurements)...........................................................9
Component measurement
Passive intermodulation (PIM) measurement..........................................................................................10
Cable and connector assembly test for USB, HDMI, SATA and DisplayPort........................................11
Tx (source) and Rx (receiver) test for SATA and MIPI..............................................................................12
Device characterization for PCB quality control.....................................................................................13
Automotive ethernet test and debug.......................................................................................................14
Automotive antenna test.......................................................................................................................... 15
RF ampliier measurements......................................................................................................................16
High-gain ampliier measurements with low power signal....................................................................17
Pulsed S-parameter measurements........................................................................................................18
RF coaxial cable measurements...............................................................................................................19
LAN/telecom cable measurements.........................................................................................................20
High-rejection ilter measurements.........................................................................................................21
Capacitance characteristics of liquid crystal cell..................................................................................22
MEMS/NEMS device modeling, failure analysis and process control..................................................23
EMC component measurement under actual operating conditions.....................................................24
Production test for inductor, EMI ilter, capacitor and register...................................................................25
On-chip device measurements with probing system.............................................................................26
Mixer and converter measurement..........................................................................................................27
Multiport device measurement (up to 40-port)..................................................................................... 28
03 | Keysight | Impedance and Network Analysis - Catalog
Table of Contents (continued)
On-wafer measurement
On-wafer C-V characterization of MOS device.......................................................................................29
On-wafer device characterization from low frequency to microwave...................................................30
Material measurement
Solid and liquid material measurements with test ixtures....................................................................31
RF material measurements using dielectric probe.................................................................................32
Phantom material evaluation for Speciic Absorption Rate (SAR) test.................................................33
Permittivity measurements of PCB and substrate materials.................................................................34
Quality evaluation of foods by dielectric measurement.........................................................................35
General purpose
Component impedance and S-parameters measurement.....................................................................36
Component impedance measurements (most accurate over broad impedance range)......................37
Temperature characteristic evaluations of RF components and materials..........................................38
Appendix
1. Product based application list..............................................................................................................39
2. Product replacement guide...................................................................................................................41
04 | Keysight | Impedance and Network Analysis - Catalog
DC-DC Converter and Power Distribution Network (PDN) Measurements
Abstract
The E5061B-3L5 LF-RF network analyzer (5 Hz to 3 GHz) with the option 005 impedance analysis function is a
comprehensive solution for evaluating frequency-domain characteristics of DC-DC converters (switching voltage
regulators) and subsequent PCB power planes (PDNs: Power Distribution Networks) which distribute the converter's DC
output power to load devices such as LSIs and other electronic devices.
Test challenges