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Resistor Production Test Using the
Agilent B2900A Series of SMUs
Technical Overview
Agilent B2901/02/11/12A Precision Source/Measure Unit
Agilent B2901A Precision SMU, 1ch, 100 fA resolution, 210 V, 3 A DC/10.5 A pulse
Agilent B2902A Precision SMU, 2ch, 100 fA resolution, 210 V, 3 A DC/10.5 A pulse
Agilent B2911A Precision SMU, 1ch, 10 fA resolution, 210 V, 3 A DC/10.5 A pulse
Agilent B2912A Precision SMU. 2ch, 10 fA resolution, 210 V, 3 A DC/10.5 A pulse
Introduction of SMUs has the ability to perform
DC measurements as well as pulsed
To ensure compliance with manufac- measurements in order to prevent
turing specifications, DC testing must device self-heating from distorting the
be performed on resistors after final measurement results. In addition to
assembly. The reliability of this test- these comprehensive measurement
ing is important to guarantee product capabilities, the B2900A Series of
quality. In addition, it is also essential SMUs possesses high throughput
to perform the tests quickly to keep that reduces test times. The B2900A
the production throughput high. Series of SMUs also has many
features that make it well-adapted
The Agilent B2901/02/11/12A for production test, such as pass/
Precision Source/Measure Unit meets fail binning, a digital I/O interface for
all of these requirements, making it the handler control, and code compat-
best solution for resistor production ibility with standard single and dual
test. It is a compact and cost-effective channel SMU products.
bench-top Source/Measure Unit
(SMU) with the capability to source This technical overview presents
and measure both voltage and current. examples that illustrate how the
They cover currents from 10 fA to 3 A B2900A Series of SMUs can be used
(DC)/10.5 A (pulse) and voltages from for resistor production test.
100 nV to 210 V. The B2900A Series
Easy production test
High force DUT interface
system configuration
Test
Figure 1 shows a conceptual diagram leads
of a system based on the B2900A
Series of SMUs for production GPIB
resistor test. The widely available LAN Low force
banana style terminals of the B2900A USB GPIO Mechanical
Series of SMUs greatly simplify the connection
test system configuration. As will be
discussed later, in most production Component handler
testing measurement results are
compared with pre-defined limits and
pass/fail judgments are made. Output Figure 1. Example test system configuration using the B2900A Series of SMUs
signals from the GPIO port of the
B2900A Series of SMUs can be used
to communicate with the component
B2901/02/11/12A B2901/02/11/12A
handler to sort devices based on the
RLead
pass/fail criteria.
High force IMeas High force IMeas
RLead
The B2900A Series of SMUs supports High sense High sense A
both 2-wire connection and 4-wire
VMeas VSet RDUT VMeas VSet RDUT
connections. A basic 2-wire connec-
tion is commonly used for standard Low sense Low sense B
resistance measurements, while a RLead
4-wire connection is required for Low force Low force
low resistance measurements to
eliminate the residual lead resistance a) 2-wire connection b) 4-wire connection
(please see Figure 2).
Figure 2. A 4-wire connection eliminates the measurement error caused by residual lead
The B2900A Series of SMUs supports resistance
several communication protocols,
GPIB, USB and LAN, and these can
be used with both SCPI and IVI-COM
drivers. SCPI is an industry-standard
command set for basic instruments
with a uniform structure that supports
a common set of commands. The
SCPI command set of the B2900A
Series of SMUs not only supports its
advanced features but also general-
purpose SMU commands (such as
those used by the Keithley 2400) to
simplify test program migration. In
addition, the IVI-COM drivers for the
B2900A Series of SMUs work in a
variety of programming environments
and languages, so you can develop
programs without having to use
low-level commands.
2
Program memory judgment based on pre-defined limits. Limit mode is usually used to deter-
Recognizing that there are a variety of mine if a device parameter is within
improves throughput pass/fail limit scenarios, the B2900A specified low and high limits. When
Fast test times are essential to Series of SMUs supports two modes: Limit mode is enabled the B2900A
maximize throughput and maintain Compliance mode and Limit mode Series of SMUs makes a Pass/Fail
high levels of factory productivity. (up to 12 binning limits possible). judgment based on whether or not
Besides possessing fast intrinsic the measured value is within speci-
measurement speed, the B2900A Compliance mode utilizes the intrinsic fied low and high limits. A typical use
Series of SMUs has a program compliance feature of the B2900A of this mode is to perform grading
memory function that can be used to Series of SMUs that allows a limit and sorting (please see Figure 4).
improve production test throughput. to be placed on voltage or current
Program memory allows you to store output to prevent device damage. After performing pass/fail testing
long strings of SCPI command lines When the SMU's output reaches the with these modes, you can view
once into the volatile memory of the limit value during a measurement it is the results on the wide QVGA LCD
B2900A Series of SMUs and then in compliance status. If Compliance display of the B2900A Series of
recall those strings multiple times mode is enabled, then the test fails SMUs. In addition, you can program
while the program is executing using when the SMU reaches compliance the B2900A Series of SMUs to output
a single SCPI command. By storing status. One possible use of this specified Pass/Fail bit patterns
the command strings in memory, the feature is to determine the polarity through the GPIO port to other
time that would have been spent of nonsymmetrical devices such as equipment such as handlers for
sending those same commands over diodes. component binning.
a communication bus is eliminated.
For tests that utilize lots of repeated
code (such as subroutines), program
Store
memory can dramatically reduce test Voltage coefficient test
times. Of course, programs can be
Resistance measurement
saved to or loaded from any attached
USB flash memory device (please see
Store/Load SCPI command line strings
Figure 3).
Program memory
The B2900A Series of SMUs also has
a data buffer on each SMU channel
that can hold up to 100,000 data
points. This enables you to transfer
all the data in the buffer at once after
a series of measurements have com- Figure 3. Program memory allows strings of SCPI commands to be stored for later execution
pleted instead of having to transfer
data after every measurement. One
way to use this to improve throughput Limit 1
would be to have the B2900A Series
of SMUs send measurement data to a Limit 2
PC while a component handler places Limit 3
a new device on a DUT interface.
Very good Good Average
Multiple pass/fail RDUT RDUT
judgment modes
In production test, a limit test func- Limit 2 PASS FAIL
tion is generally used to eliminate
Figure 4. Example showing how Limit mode's pass/fail test capability can be applied to a
defective devices through a pass/fail Figure 4. Example showing how Limit mode's pass/fail test capability can be applied to a resistance measurement
resistance measurement
3
Production resistor test component handler. Once the resistor Summary
is in-place, the handler sends an SOT
flow example trigger signal to the B2900A Series The Agilent B2901/02/11/12A
Figure 5 shows a simplified flow for of SMUs to inform it that testing can Precision Source/Measure Unit is
production resistor testing. Before begin. The B2900A Series of SMUs the best solution for the production
beginning the actual testing, it is first makes a measurement using the testing of LEDs and other devices.
good practice to store repeated programs stored in program memory The B2900A Series of SMUs pos-
operations into the program memory and displays the Pass/Fail testing sesses high throughput, which greatly
of the B2900A Series of SMUs (such result. Then, the B2900A Series of reduces test times. In addition, the
as the resistance measurement in SMUs sends a specified Pass/Fail program memory function of the
this example). After this test pre- bit pattern and an End of Test (EOT) B2900A Series of SMUs allows the
loading has been performed and the signal to the component handler and test throughput to be improved even
stored program has been run, the stores the test data to the PC. This more. The B2900A Series of SMUs
B2900A Series of SMUs waits for a procedure is then repeated until all also provides useful features for
Start of Test (SOT) trigger from the of the devices have been tested. production test such as pass/fail
decision-making, a digital I/O inter-
face for handler control, and program
Start compatibility with standard single and
dual channel SMU products.
Store SCPI command line strings to the program memory
The B2900A Series of SMUs is
Resistance measurement Resistance measurement equipped with popular banana
style terminals that make it easy to
1. Set compliance VComp
IF IF Pulsed current connect to other instruments in a
2. Force DC or pulsed current IF DC current production test system. Both SCPI
3. Measure resistance (RT)
time time commands and IVI-COM drivers are
available for the B2900A Series of
Voltage coe cient test SMUs for remote control using the
1. Set 2-point voltage sweep measurement at VF1 and VF2 RDUT2 GPIB, USB or LAN communication
2. Select voltage coefficient math expression RDUT1 protocols.
3. Measure resistance RDUT1 and RDUT2
4. Request voltage coefficient data VF1 VF2
Its wide current and voltage measure-
(R DUT 2 - RDUT1 )
Voltage coeffient =
RDUT1 (VF 2 -VF1 )
x 100%