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Agilent EEsof EDA
W2302EP/ET Advanced Design System
Transient Convolution Element
W2500EP/ET Transient Convolution
GT Option
W2312EP/ET Transient Convolution
Distributed Computing 8-pack
Figure 1. Eye diagram results from the ADS Transient-Convolution Simulator show excellent
correlation with measurements, enabling rapid "what if" design space exploration.
Agilent EEsof EDA--the technology and innovation leader in high-speed, high-frequency
electronic design automation--takes SPICE to a new level with the ADS Transient
Convolution Element. This simulator is the industry's fastest signal integrity circuit
simulator for multigigabit, high-speed data link design. Multicore processor support
and a new, high-capacity sparse matrix solver achieves a three-fold simulation speed
improvement for signal integrity simulations.
Design and verification of chip-to-chip multigigabit/s serial links is the morst common
application for the Transient Convolution Element. At the very high data rates at
which these links operate, signal integrity engineers must take into account physical
phenomena such as impedance mismatch, reflections, electromagnetic coupling,
crosstalk and microwave frequency attenuation due to the skin effect and dielectric loss
tangent. The simulator allows signal integrity engineers to perform "what-if" design
space exploration using a circuit-level model that can be verified against measured data,
and electromagnetic simulation on the post-layout artwork to arrive at an optimum design
while avoiding costly and time consuming prototype iterations.
W2302EP/ET Transient Convolution Element
The Transient Convolution Element includes: