5991-2524EN Optimizing On-Wafer Noise Figure Measurements up to 67 GHz - Application Note c20140917 part of Agilent 5991-2524EN Optimizing On-Wafer Noise Figure Measurements up to 67 GHz - Application Note c20140917 5991-2524EN Optimizing On-Wafer Noise Figure Measurements up to 67 GHz - Application Note c20140917 , Agilent 5991-2524EN Optimizing On-Wafer Noise Figure Measurements up to 67 GHz - Application Note c20140917 [20].pdf text manual preview

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Keysight Technologies
Optimizing On-Wafer Noise Figure
Measurements up to 67 GHz

Application Note
Introduction

Noise figure (NF) measurements are often an essential part of device characterization in R&D
and process verification in manufacturing. Getting accurate on-wafer NF measurements can be
quite challenging, and the ability to get good results depends on the methodology and the test
configuration.

Two techniques are commonly used to measure NF: the Y-factor method and the cold-source
method. The Y-factor or hot/cold-source method is the predominant approach and is most commonly
implemented with noise-figure analyzers and spectrum analyzer-based solutions. In contrast, the
cold-source method is usually performed using vector network analyzers (VNAs), which provide
magnitude and phase information. As a result, the cold-source technique makes it possible to achieve
much greater accuracy in NF measurements.

This application note presents a cold-source solution based on the Keysight Technologies, Inc.
PNA-X microwave network analyzer. When equipped with the optional source-corrected NF
measurements (Option 029), the PNA-X provides exceptional accuracy. New hardware provides a
convenient way to make measurements up to 50 GHz. Now, additional external hardware is needed
only when making measurements from 50 GHz to 67 GHz. The PNA-X also enables a time-saving
advantage: the ability to make multiple measurements such as noise figure, S-parameters, gain
compression and intermodulation distortion (IMD) with a single set of connections to the device
under test (DUT).
03 | Keysight | Optimizing On-Wafer Noise Figure Measurements up to 67 GHz - Application Note

Overview: Noise figure
Noise factor, which is linear, and noise figure, which is logarithmic, are very
useful