Text preview for : 5991-3093EN Protect Against Power-Related DUT Damage During Test - Application Note c20141107 [6].pd part of Agilent 5991-3093EN Protect Against Power-Related DUT Damage During Test - Application Note c20141107 [6] Agilent 5991-3093EN Protect Against Power-Related DUT Damage During Test - Application Note c20141107 [6].pdf
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Keysight Technologies
Protect Against Power-Related
DUT Damage During Test
Application Note
Overview
If you want to meet your delivery and budget goals, it is important to protect your devices against
damage during test, especially for high-value aerospace/defense and automotive devices, but also
for any devices that are time consuming and costly to replace. When the risk of device damage is
of signiicant concern, test planning should include strategy and equipment that can help to reduce
such risk. Choosing a power supply with extensive integrated protection features is the best way
to avoid power-related damage to your DUT and to reduce test-system development investment
by minimizing overall system hardware. In this application note, we will look at how the extensive
protection features of the new Advanced Power System from Keysight Technologies, Inc. can protect
your DUT from costly damage.
Problem
Controlling power supply output voltage and current to avoid overstressing the DUT under fault or
near-fault conditions requires a rapid and effective response to a variety of situations. The primary
causes of DUT failure are over-voltage and over-current events, some of which are very short duration
while others endure until they are discovered.
An over-voltage or over-current event can occur for a variety of reasons, including: