Text preview for : 5991-3295EN Elastic Modulus Mapping Using the 7500 AFM - Application Note c20141020 [4].pdf part of Agilent 5991-3295EN Elastic Modulus Mapping Using the 7500 AFM - Application Note c20141020 [4] Agilent 5991-3295EN Elastic Modulus Mapping Using the 7500 AFM - Application Note c20141020 [4].pdf



Back to : 5991-3295EN Elastic Modul | Home

Keysight Technologies
Elastic Modulus Mapping
Using the 7500AFM




Application Note




Introduction
The atomic force microscope (AFM) 1 has become a very important tool
for investigating samples on the nano-scale. It combines in a unique
way high spatial resolution with very high force sensitivity, allowing for
mapping of elastic properties with highest spatial resolution.

For quantitative determination of elasticity a force distance curve is
obtained. From such a force distance curve the elastic modulus can be
extracted. A mapping of local elastic properties is achieved by obtain-
ing two-dimensional arrays of force distance curves. Such elasticity
maps can be used to derive information on cellular processes. In par-
ticular, elasticity measurements provide valuable insights into various
dynamic cellular processes such as cell migration and cell division.

Here, we show how the Keysight Technologies, Inc. 7500 AFM can be
utilized to map the elastic modulus of endothelial cells.
02 | Keysight | Elastic Modulus Mapping Using the 7500AFM - Application Note


Figure 1. Topographical images.
Contact mode images of a
sample cell were made to char-
acterize cell morphology. The
left image shows an overview
(50 x 50