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Excerpt Edition
This PDF is an excerpt from Chapter 5
of the Parametric Measurement Handbook.
The
Parametric Measurement
Handbook

Third Edition
March 2012
Chapter 5: Time Dependent and High-Speed Measurements
"Experience is something you don't get until just after you need it." -- Anonymous

Introduction
One of the most prominent trends in parametric test is the movement away
from simple sweep and spot measurements (where measurement time is not an
important part of the measurement) to measurements where the speed at which
the measurement must be made is critical to the accuracy of the measurement.
In some cases this requires new types of measurement modules other than
SMUs, or even the integration of external instruments (pulse generators, oscil-
loscopes, etc.) with the parametric measurement equipment. However, some
of the newer parametric instruments (such as the Agilent B1500A and B1505A)
can make some impressive time sampling measurements just with their SMUs,
so it is worthwhile to spend some time discussing all of the available measure-
ment options.

Parallel measurement with SMUS
Parallel measurement is an important capability for all time dependent testing
done with SMUs. True parallel measurement with SMUs is only possible when
each SMU has its own analog-to-digital converter (ADC) available to it. The
Agilent parametric instruments with this capability are the E5270B, the B1500A
and the B1505A. For all of these instruments (except the E5260A Series), you
can select either a shared high-resolution (HR) ADC or a per-SMU high-speed
(HS) ADC for all of the various types of IV measurements as shown below.

High-speed A
ADC V

High-speed A High-resolution ADC
ADC V