Text preview for : 5989-5587EN SATA II Drive TX RX Testing & Cable SI Testing Using the 86100C DCA-J - Technical Overvi part of Agilent 5989-5587EN SATA II Drive TX RX Testing & Cable SI Testing Using the 86100C DCA-J - Technical Overvi Agilent 5989-5587EN SATA II Drive TX RX Testing & Cable SI Testing Using the 86100C DCA-J - Technical Overview c20140829 [26].pdf
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Keysight Technologies
SATA II Drive Tx/Rx Testing & Cable SI Test
Using the 86100C DCA-J
Technical Overview
Overview: Table of Contents
Serial ATA (SATA) is the latest generation of the ATA internal Cable Testing:
storage interface. Due to the inherent limitations of parallel
1. Introduction ............................................................................. 3
technology, SATA is expected to replace parallel ATA
2. Instrument Setup and Calibration ........................................ 4
everywhere, and expand the use of ATA-based technology in
3. SI-01, Mated Connector Impedance .............................. 9, 10
the entry server and network storage market segments.1
4. SI-02, Cable Absolute Differential Impedance ............. 9, 10
5. SI-03, Cable Pair Matching .............................................11, 12
The "SATA 1.0" and "SATA II" terminology represent a family
6. SI-04, Common Mode Impedance ................................. 9, 10
of specifications, while "SATA 1.5 Gb/s" and "SATA 3 Gb/s"
7. SI-05, Differential Rise Time .......................................... 13, 14
references indicate products and their supported speeds that
8. SI-06, Intra-Pair Skew .....................................................13, 14
were developed under these respective specifications. All
9. SI-07, Insertion Loss .........................................................13,14
products developed underSATA 1.0 have a maximum speed
10. SI-08, Differential to Differential Cross Talk (NEXT) ........12
of 1.5 Gb/s. Productsdeveloped under SATA II can either be
11. SI-09, Inter-Symbol Interference ...................................... 13
1.5 Gb/s or 3 Gb/s. In addition, the SATA II specifications are
backward compatible with the SATA 1.0 specification.1
Internal Drive Testing:
Many devices are covered by the SATA standard and each 12. Introduction ........................................................................... 5
device has its own test requirements. The SATA standard 13. Instrument Setup and Calibration ..................................... 16
and the associated Interoperability Test Program Unified 14. Tx-01, Pair Differential Impedance .....................................17
Test Document define the following testing requirements for 15. Tx-02, Single-Ended Impedance ......................................... 8
internal drives and internal cables with additional devices and 16. Tx-03, Differential Mode Return Loss ............................... 18
requirements being 17. Tx-04, Common Mode Return Loss ................................... 19
added regularly: 18. Tx-05, Impedance Balance ................................................. 19
19. Rx-01, Pair Differential Impedance ................................... 19
Drives: Cables: 20. Rx-02, Single-Ended Impedance ...................................... 19
PHY General, 1-4 SI 1-9 21. Rx-03, Differential Mode Return Loss .............................. 20
PHY TX 1-6 22. Rx-04, Common Mode Return Loss ................................. 20
PHY TSG 1-12 23. Rx-05, Impedance Balance ............................................... 20
PHY RX 1-6
PHY OOB 1-7
This Product Note, based on SATA approved Methods of
Implementation, explains how to use the Keysight Technologies,
Inc. 86100C DCA-J (high bandwidth equivalent time sampling
oscilloscope and Time Domain Reflectometer) to make the
required Rx and Tx tests for internal drives and the required SI
tests for internal cables.
Keysignt's SATA approved Method of Implementation explaining
how to make the PHY General, TSG and OOB tests using
Keysignt's DSO81204A/B (12 GHz bandwidth, 40 Gb/s per
channel) is available on Keysignt's web site
www.keysignt.com/find/n5411A.
03 | Keysight | SATA II Drive Tx/Rx Testing & Cable SI Test Using the 86100C DCA-J - Technical Overview
Procedure, Testing SATA II Tests SI-01 through SI-08 use Time Domain Reflectometry (TDR)
techniques to measure impedance in the time domain with test re-
Internal Cables with the sults reported in the time domain or frequency domain (S-Param-
Keysight 86100C DCA-J: eters) as required by the standard. The 86100C DCA-J with option
202 can easily translate between the time and frequency domains
with a single button push.
Introduction
This procedure describes how to setup and use the 86100C DCA-J Test SI-09 is performed by making an actual jitter measurement
to make the following measurements on a SATA internal cable to on the specified data pattern sent through the cable being tested.
determine if the cable meets the requirements of the standard: The 86100C DCA-J with option 200 performs complete jitter
analysis at the touch of a button, reporting Total Jitter and all jitter
SI-01 Mated Connector Impedance
subcomponents,including ISI (inter-symbol interference).
SI-02 Cable Absolute Impedance
SI-03 Cable Pair Matching
The SATA standard for testing the internal cable is quite complex:
SI-04 Common Mode Impedance