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June 2008
FDG6322C
Dual N & P Channel Digital FET
General Description Features
These dual N & P-Channel logic level enhancement mode N-Ch 0.22 A, 25 V, RDS(ON) = 4.0 @ VGS= 4.5 V,
field effect transistors are produced using Fairchild's
RDS(ON) = 5.0 @ VGS= 2.7 V.
proprietary, high cell density, DMOS technology. This very
high density process is especially tailored to minimize P-Ch -0.41 A,-25V, RDS(ON) = 1.1 @ VGS= -4.5V,
on-state resistance. This device has been designed
RDS(ON) = 1.5 @ VGS= -2.7V.
especially for low voltage applications as a replacement for
bipolar digital transistors and small signal MOSFETs. Since Very small package outline SC70-6.
bias resistors are not required, this dual digital FET can
replace several different digital transistors, with different bias Very low level gate drive requirements allowing direct
resistor values. operation in 3 V circuits (VGS(th) < 1.5 V).
Gate-Source Zener for ESD ruggedness
(>6kV Human Body Model).
SC70-6 SOT-23 SuperSOTTM-6 SOT-8 SO-8 SOIC-14
S2 1 6
G2
Q1
D1
2 5
D2 Q2
pin 1 G1
S1 3 4
SC70-6
Mark: .22
Absolute Maximum Ratings TA = 25oC unless other wise noted
Symbol Parameter N-Channel P-Channel Units
VDSS Drain-Source Voltage 25 -25 V
VGSS Gate-Source Voltage 8 -8 V
ID Drain Current - Continuous 0.22 -0.41 A
- Pulsed 0.65 -1.2
PD Maximum Power Dissipation (Note 1) 0.3 W
TJ,TSTG Operating and Storage Temperature Range -55 to 150