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Date: 08/20/2007
Product: TDSRT-Eye Serial Compliance and Analysis with
SA - Serial Analysis Module
IBA - InfiniBand Compliance Module
PCE - PCI Express Compliance Module
SST - SAS Compliance Module
- SATA Compliance Module
FBD - FB-DIMM Compliance Module
Version: v3.1.0 (August 20, 2007)

===============================================================
Contents of this Readme File:

1. System Requirements
2. Contents of Distribution
3. New Features
4. Release Notes
5. Known Problems
6. Installation
7. Contact Information


===============================================================
1. System Requirements

- The TDSRT-Eye Application is intended for Tektronix oscilloscopes that
support 4.0GHz or higher bandwidth, however the Serial Analysis module can be
used on systems with a bandwidth as low as 1.5GHz.
The optional PCI Express (opt. PCE) and Infiniband (opt. IBA) compliance
modules operate on 4.0GHz systems, e.g., TDS6404, TDS6604, TDS6604B, TDS6804B,
TDS6124C, TDS6154C, TDS7404/B, TDS7704/B, and CSA7404/B, and DPO/DSA70404,
DPO/DSA70604, DPO/DSA70804, DPO/DSA71254, DPO/DSA71604, and DPO/DSA72004.
The optional Fully Buffered DIMM compliance module (opt. FBD), Serial ATA
(SATA) and Serial Attached SCSI (SAS) Analysis comp[liance modules (opt. SST)
only operate on 6.0GHz or higher bandwidht systems, specifically the TDS6604,
TDS6604B, TDS6804B, TDS6124C, TDS6154C, TDS7704B, DPO/DSA70604, DPO/DSA70804,
DPO/DSA71254, DPO/DSA71604, and DPO/DSA72004 instruments.

- This product is intended for use on Windows 2000/Windows XP based
instruments and requires target systems to have 1024MB of system memory if
record lengths in excess of 4Mpt are to be analyzed.

- Note that the recommended MS Windows(TM) task bar settings for running this
application are:
- Always on top = unchecked
- Auto Hide = unchecked


- Disk space requirements:
200 MB of free disk space is required to install and operate this application
including all compliance modules. Less space is required if only a subset of the
available modules is installed.

- It may be necessary to configure file/folder properties to allow users
privileges to create and write. Consult the appropriate Microsoft
documentation for details.

The following folders and their contents may need to be so configured:
C:\Program Files\TekApplications\tdsrt-eye
C:\TekApplications\tdsrt-eye

- Sun Microsystem's Java Runtime Environment (JRE) version 1.4.2_04 is
required for this release and is automatically installed with the application.

- P7330, P7350/SMA, P7380/SMA, P7313 differential probes, P7260 single ended
probes, and P7500 family of TriMode active probes are intended as the principal
interface to the device under test for this analysis tool. The user should
ensure that the probing configuration selected in this tool matches their physical
setup.

P7380/P7380SMA/P7313 differential probes and P7500 series Tri-Mode active probes
and direct SMA/SMA or SMA/SMP cable connections are the principal interface to the
device under test for FB-DIMM/SAS/SATA testing.

- Refer to the TDSRT-Eye online help for more requirements.

===============================================================
2. Contents of Distribution

- TDSRT-Eye v3.1.0 Serial Compliance and Analysis Software (opt. RTE)
- PCE v3.1.0 PCI Express compliance Module (opt. PCE, requires RTE)
- IBA v3.1.0 InfiniBand compliance Module (opt. IBA, requires RTE)
- SATA v3.1.0 Serial ATA compliance Module (opt. SST, requires RTE)
- SAS v3.1.0 Serial Attached SCSI compliance Module (opt. SST, requires RTE)
- FB-DIMM v3.1.0 Fully-Buffered DIMM compliance Module (opt. FB-DIMM,
requires RTE)
- Tektronix Report Generation Tools (Serial Analysis, IBA, PCI, SAS, SATA and FB-DIMM
templates and layouts included above
- MATLAB(TM) Release 13 RunTime Server
- SUN JAVA(TM) Runtime Engine version 1.4.2_04



===============================================================
3. New Features

08/01/2007 (V3.1.0)

- Serial Analysis Module (SA):

1. Math has been added as an available measurement source in for differential
probe type.

2. Improved handling of undersampled waveform data.

3. Improved the Remote Autoset commands for PCE, FBD, IBA, SAS and SATA modules.

4. Changing from Single Ended to Differential probe type automatically disables any
selected plot mask to avoid incorrect pass/fail testing.

5. Improved high performance 'eye' rendering which gives more accurate worst case
jitter.

6. Improved binary waveform read operations for file based input.

7. Improved and expanded Statndards Support Library: Library now includes mask,
limit, and setup(.ini) files for several technologies such as Display Port, OBSAI,
Ethernet, Rapid IO, XAUI CX4, etc. Additional details are provided in the on-line
help and later in this readme file.

- PCI-Express Module (PCE):

1. A dialog box was added for SigTest support that allows presetting the appropiate
sample rate values for DPO/DSA and TDS oscilloscope waveform files: 50GSa/s for
DPO/DSA, and 40GSa/s for TDS oscilloscopes. Additional details are provided in the
on-line help text, with complete instructions for entering the sample rate and
data file path used by SigTest.

2. Reference Clock testing is enabled only when PCI-E v1.1 testing is selected. It
is disabled when PCI-E v1.0 and v2.0 testing is selected.

3. The Eye Height measurement algorithm was changed to use equation:
EyeHeight=(Vtop-Vbase)
Earlier releases used the PCI-E equation
EyeHeight=2*min(abs(Vtop - Vref),abs(Vbase - Vref)).
The original equation could yield unexpected results on waveforms with significant
common mode or DC offset.

4. Improved mask violation tracking and detection results in fewer false mask hits
in marginal waveforms.

- Serial ATA Module (SST):

1. Improved Risetime and Falltime calculation and reportings.

- Applicable to ALL modules:

1. Waveform plots of transition & non-transition bit eye diagrams are now
automatically stored as JPEG format binary images (.jpg) and can be copied from
the folder C:\TekApplications\tdsrt-eye\images.

2. An issue resulting in old report data being reused in current reports has been
resolved. Old report data are cleared prior to new report generation. Due to the
available file system performance settings in Microsoft Windows, caching of file
data can occasionally leave unexpected remnants (cases are suspected where the
delete command executes prior to the when OS actually flushes write data to disk
and a "file not found" error occurs), therefore users are also advised to
occasionally examine and delete files in the C:\temp folder.

3. Report generator templates updated for PCIE and SATA differential amplitude
measurements.


- 01/12/2007 (V3.0.2)
Added support for 12.5GHz, 16GHz and 20GHz DPO/DSA oscilloscopes.
Provides improvements in SATA Amplitude measurements.
Provides increased range for clock recovery PLL damping ratio: upper limit is
increased to 2.0.
Provides Report Generator Install Dialog improvements.
Updates to PCE module PCI Express reference clock, data measurements, and limits
testing.
Updates to FBD module FB-DIMM TxLrg3.5dBDIMM and TxLrg6.0dBDIMM test point files.

- 09/07 (V3.0.1)
Corrected issues with SATA measurements and PCI-Express / Infiniband modules.

- 07/06 (V3.0.0)
Added support for DPO and DSA oscilloscopes.

- 06/06 (V2.0.5)
Resolved several defects in SATA (SST), PCIE (PCE) and FB-DIMM (FBD) modules.

- 02/06 (V2.0.2)
Added N-Period measurement (per SATA 1.0) to the SATA (SST) module.
Improved the clock recovery algorithms.

- 10/05 (v2.0.1)
Resolved a reference clock jitter measurement issue in the PCI-Express (PCE)
and FB-DIMM (FBD) modules.

- 08/05 (v2.0.0)
New FB-DIMM module introduced, covering fully buffered DIMM module data rates of
3.2, 4.0, and 4.8Gb/s.
Major updates to PCE module to address updates to PCI-Express Rev 1.0a, Rev 1.1,
and Rev 2 (latest) standards.
Added filtered reference clock measurements to FB-DIMM (FBD) and PCI-Express (PCE)
modules.
Added integration of SigTest to FB-DIMM (FBD) and PCI-Express (PCE) modules.
Added support to PCI-Express (PCE) module for new test points (Cable, Expansion
Module, Mobile, etc.)
Added Rj/Dj analysis of arbitrary patterns.
Added Dual-Dirac Rj/Dj/Tj analysis added where required by standards.
Added 3D color-graded eye rendering, with incremental update of eye.
Enhanced clock recovery, including 1st-order PLL + nominal bitrate support.
Added Set-up Wizard to provide step-by-step guidance for many tasks.
Added MyTest feature for one-button access to custom measurements.
Corrected issues with several Serial Attached SCSI masks.

- 03/05 (v1.3.5)
Minor enhancements to ensure that PDF versions of manuals start properly on all
platforms.

- 02/05 (v1.3.4)
Resolved issues with incorrect SATA mask hits.
Added Waveform Plot as option to Eye Diagram measurements.
Trend plots were removed.

- 09/04 (1.2.0)
Added SATA and SAS modules (opt. SST).
(The 5-time free trials is shared between the SATA and SAS modules.)

- 06/04
Updated the PCI-Express masks to reflect a choice of System Board or Add-In card eye
geometries.
Corrected a rare initial bit estimation error on ultra low jitter signals.

- 11/04
Added PCI-Express setup files for midbus connector for Serial Analysis module.
Added XGA support.
Added Explicit Autoset for InfiniBand and PCIExpress modules. The button appears
on the Measurement Select area.
Added RGPIB commands for Autoset: autosetIBA; autosetPCE; autosetFB-DIMM.
Corrected PLL selections for IB module.

===============================================================
4. Release Notes

- Beginning with Serial Analysis version 2.0.0, the setup file format has
been revised. You may recall and use setup files from prior versions.
In this case the application will use logical defaults for any control
parameters not formerly present. You may wish to review the settings to
verify that any new parameters are acceptable. You may then resave the
setup file to the same name to permanently update it to the new format,
or save it to a new name if you wish to retain the old setup file.
The new file format is not backward compatible.

- In compliance modules, only measurements for which the specification gives
PASS/FAIL limits will appear in the Results>Summary panel. If you select
additional measurements, results will only show up in the Results>Details
panels.

- The AC Common-Mode Voltage measurement has been changed from a peak to an
RMS measurement. This change conforms with specification requirements. If a
setup file from a prior version of RT-Eye contains an AC CM voltage measurement,
the current RMS measurement will NOT be turned on during recall of the file.

- This release of the RT-Eye application includes several minor improvements
to areas such as PLL clock recovery, Rj/Dj separation, smart-gating boundary
conditions and the calculation of reference levels. These may lead to small
variations in measurement results between this version and prior versions,
for identical waveforms.

- FREE TRIALS

* If you install the software for a module for which an option key has not
been installed, you will have 5 free trials of that module.

* In the case of the Serial Analysis module, a free trial will be consumed
each time you launch the RT-Eye application.

* In the case of the other (optional) modules, you may enter a module and
explore its user interface at any time; the free trial will not be
consumed until you either run an Autoset or a measurement. You may then
run additional measurements; a new free trial will not be required unless
you leave the module and re-enter it.

* Since the SAS and SATA modules both use the same option (SST) and key, you are
allowed a total of five free trials shared between these modules, e.g. two
trials of SAS and three trials of SATA.


===============================================================
5. Known Issues

General Notes:

- Eye rendering of record lengths in excess of 4MPt place a large demand on system
resources, incur large processing times, and should be avoided unless
MATH is used as source, in which case 10Mpts is the recommended limit.
However, all limitations related to record length may be disabled by
creating a file called unlimitedRL.txt and placing it at
C:\TekApplications\tdsrt-eye. (The filename is case-sensitive. The file
itself can be empty.) If RT-Eye is launched after this file is created,
no record-length limits will be enforced. Operation in this configuration
is not supported.

- When creating a custom eye mask, it must have exactly three segments defining the
high (upper), middle (center), and low (lower) keep-out areas, and they must
appear in that order. Consult supplied masks for examples.

- The "Use Sigtest" feature in RT-Eye provides a mechanism to use the
Sigtest software from within the PCI-Express or FB-DIMM modules. Some
versions of Sigtest may include alpha or beta code. If the Sigtest utility
becomes unresponsive, we recommend that you:
A) Press the "Exit Sigtest" button provided in the RT-Eye application.
B) Use the Windows Task Manager to end the "Sigtest.exe" process, if
Step A is ineffective.

08/01/2007

- Serial Analysis(SA) Module:

1. The Display Port CTS specification/procedure is evolving and requires
clarification on the EYE diagram mask coordinates and the limit files. The
mask and limit files supplied currently are in accordance with Draft-6 and
Draft-11 of CTS and Ver1.1 standard. The normalized eye concept is taken
from Draft-6 and the eye coordinates are taken from Draft-11 of the CTS.
There is also need for clarification on the Total Jitter value specified and
eye-width in the CTS. As the CTS standard evolves, changes to the Display Port
limit files and mask templates will be needed. Updates will be included in
future releases of this application.

2. The oscilloscope setup files (.set) provided for various technologies such as
Display Port, SAS(1.5, 3.0and 6.0G), FB-DIMM, IB, XAUI, Serial RIO, and OBSAI
work with DPO/DSA series oscilloscopes. These setup files will not work with
TDS oscilloscopes. Users working with TDS series oscilloscopes must manually
create appropriate oscilloscope setups before using the standards library
templates.

3. When recalling setup files (.ini and .set files) for each technology for the
Serial Analysis module, reference levels are recalled that are near the expected
signal levels. However these recalled values are static and are not ideal for all
cases. It's strongly recommended users RUN a RefLevel autoset prior to sequencing
tests. Running tests without autosetting RefLevels may result in errors and
inaccurate measurement results.

4. Serial Analysis 'Summary' Status Panel may not show all measurement results
shown on the detailed results panel. This is by design. Generally, only results
required for complaince testing are included on the results summary.

5. In SA module the StandardsSupportLibrary.MOI.pd is not listed under HELP menu. However
this PDF can be accessed from the Windows path (Start->Programs->TekApplications->TDSRT-Eye).

6. The Report Generator is selected from Utilities->Reports in the application and it can take
some time (5-7 seconds) to come up. This is for the first time only and subsequent selection of
the Report Generator is faster.


-InfiniBand (IBA) Module:

1. IBA module Autoset feature is ineffective if measurements are Disabled.

- Serial ATA and SAS Module:

1. When performing compliance tests, always display units as "Seconds"
to ensure conformance with SATA WG specs. When display units are "Unit
Interval", the measured values and limits of measurements like Rise/Fall Time
are calculated from the measured mean UI duration for each sequence.

2. We recommend that you perform Bit Rate measurement on HFTP (0101010101b) or
Align pattern. Patterns that do not contain a bit sequence of '010' or '101'
may cause incorrect clock recovery, leading to errors in Bit Rate, Eye
Height/Width, and other measurements.

3. When the SATA input source is set for file, it is necessary to complete all
the dialog steps otherwise the file name selection will not be reflected and
the desired files will not be loaded correctly. Use the 'Browse' button to
select the file name. Select and/or Edit the file name in the file path and
always press