Text preview for : 5991-3103EN Optimize Transceiver Test Throughput with the Keysight PXIe Vector Signal Analyzer and G part of Agilent 5991-3103EN Optimize Transceiver Test Throughput with the Keysight PXIe Vector Signal Analyzer and G Agilent 5991-3103EN Optimize Transceiver Test Throughput with the Keysight PXIe Vector Signal Analyzer and Generator c20140828 [7].pdf
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Keysight Technologies
Optimize Transceiver Test Throughput with the
Keysight PXIe Vector Signal Analyzer and Generator
Application Note
Accelerate transceiver test throughput with the Keysight M9391A PXIe Vector Signal Analyzer
and M9381A PXIe Vector Signal Generator. Achieve cost reductions in test while maintaining
high test quality.
Abstract
Transceivers are one of the basic building blocks of modern The Keysight Technologies, Inc. M9381 PXIe Vector Signal
communication systems. They are used in a variety of devices Generator (PXI VSG) and the M9391A PXIe Vector Signal
including mobile phones, wireless LAN access points and Analyzer (PXI VSA) offer features that enable the engineer to
cellular infrastructure. Engineers who test transceivers are quickly cover a large range of test requirements. The PXI VSG
looking for solutions that will enable an increased level of provides fast switching, flexible timing and synchronization,
calibration required by modern communication standards as well as the ability to use a variety of modulated wave-
and synchronization to the test system. At the same time, forms. The PXI VSA provides fast power level changes and
pressure on prices of these devices place greater demands frequency offsets as well as on-board integrated power mea-
on engineering teams to reduce the cost of test and increase surements with list mode capabilities that further accelerate
production and test throughput. measurement speeds.
2
Introduction between points, flexibility in timing and synchronization and
the ability to use a variety of modulated waveforms.
This application note provides an overview of the key
issues in transceiver test as it relates to the selection and Timing and frequency synchronization
performance of the RF signal analyzer and generator. Further,
The two primary drivers for synchronization between the VSG
it describes how the Keysight M9381A PXIe VSG (PXI VSG)
and the transceiver DUT are the use of list modes mentioned
achieves superior performance in transceiver test systems
before, and testing of the transceiver in an operational mode.
through offering fast switching times, list mode and flexible
timing and frequency synchronization. Likewise, the Keysight
There are two basic synchronization methods with list modes.
M9391A PXIe VSA (PXI VSA) completes the high performance
First, there is a single trigger event that starts the lists in both
transceiver RF test set with its fast power level changes and
the VSG and the DUT and the entire list is timed from that
frequency offsets.
single trigger. If the beginning of point N is timed from the
beginning of point N-1, small errors in timing can accumulate
Key Issues faced in Transceiver and cause the VSG and DUT to lose synchronization over
time. In this mode, it is very important for every step in the
Production Test list to be accurately scheduled relative to the trigger event.
This requires a VSG with accurate list mode timing and the
This application note addresses transceiver test challenges ability to lock to the DUT frequency reference. Transceiver
faced by engineers including: calibration typically uses this approach and relies on both the