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ACS Basic Semiconductor Parametric Test Software
Edition for Component and Discrete Devices
Optimized for parametric testing of component
and discrete (packaged) semiconductor devices,
ACS Basic Edition maximizes the productivity
ACS systems optimized for component characterization applications
ACS systems optimized for component characterization applications
of technicians and engineers in research and
development. The versatile architecture of this
software allows it to meet the wide ranging and
ever changing requirements of semiconductor
device testing. It supports all of Keithley's source
and measure instrument products, including
Series 2600A, Series 2400, and Model 2651A
SourceMeter instruments and the Model
237 SMU.
This powerful, yet cost effective solution
includes Keithley's rich set of proven parametric
libraries. Simply choose the desired test and
begin running it to immediately start gathering
data and analyzing it. Users also have the option
of customizing any test with the embedded
script editor.
The built-in data analysis tools allow users to quickly analyze the parametric data. For example, place