200SCS Low Current Application Note.pdf part of Keithley 200SCS Low Current Application Note 200SCS Low Current Application Note.pdf, Keithley SCS 4200 200SCS Low Current Application Note.pdf text manual preview

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Number 2959

Application Note Optimizing Low Current Measurements
Series with the Model 4200-SCS
Semiconductor Characterization System
Introduction
IS
FORCE HI
Many critical applications demand the ability to measure very
low currents--such as picoamps or less. These applications
include determining the gate leakage current of FETs, testing RS
sensitive nano-electronic devices, and measuring leakage current IM
of insulators and capacitors.
VS IOFFSET
The Model 4200-SCS Semiconductor Characterization System,
COMMON
when configured with the optional Model 4200-PA Remote
Preamp, offers exceptional low current measurement capability
Current Source SMU or PreAmp
with a resolution of 1E