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New semi test applicatioNs demaNdiNg greater
throughput aNd maximum low curreNt performaNce?
Time to demand the new industry standards for high-speed switching.
Semiconductor test applications that require higher-speed test Even more important, these new switch mainframes
sequences and greater overall throughput demand our newest help you test faster, more flexibly, and more cost-effectively
high-speed semiconductor switch mainframes, the six-slot than ever before:
Model 707B and the single-slot Model 708B. They're ideal
companions for Keithley's line of high-performance matrix n NEW digital control platform for higher throughput:
switch cards, including our industry-standard, ultra-low- This new platform supports dramatically faster command-
current Model 7174A Air Matrix card and the Model to-connect speeds for higher test throughput. Even in the
7072-HV High-Voltage Semiconductor Matrix Card, which slowest mode, you can boost throughput by as much as 40%
can deliver up to 1300V to any pin on the DUT or probe card. without any code changes.
n NEW interfaces for greater flexibility: Now you can
n Low-leakage matrix configurations with up communicate with or program either mainframe remotely
to 576 crosspoints per mainframe via the LXI/Ethernet connection, USB port, GPIB, and our
ultra-fast TSP-Link