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LeCroy Test and
Measurement Products
Table of Contents
1 Digital Oscilloscopes 5
Table of Contents
Fundamentals of Digital Oscilloscopes and Waveform Digitizing 6
The Benefits of Digital Oscilloscopes 15
WavePro Color Oscilloscopes 18
WavePro Selection Guide 18
WavePro Specifications 28
Waverunner-2 Series Color Oscilloscopes 34
Waverunner-2 Selection Guide 42
Waverunner-2 Upgrade Guide 43
Waverunner-2 Specifications 45
Waverunner Series Color Oscilloscopes 50
Waverunner Series Selection Guide 52
Waverunner Upgrade Guide 53
LT364, LT364L, LT344, LT344L, LT342, LT342L ,LT322, LT224 54
Literunner Digital Oscilloscopes 58
Applying the Power of DSOs to High-speed Digital Design 60
2 Digitizing Systems 69
PXI Digitizers 70
High Throughput Digitizers:The LSA1000 Series 73
3 Analog Oscilloscopes 79
Analog Oscilloscope Selection Guide 81
LA354 82
LA314/LA314H 85
LA302/LA303 88
The Analog Advantage 91
4 Probes and Accessories 97
Passive Probes -- PP002/PP005/PP006/PP062/PP063/PP065 99
Active Probes -- AP020/AP022 103
Active Differential Probes -- AP033/AP034 106
1
LeCroy Test and Measurement Products
Table of Contents (continued)
High Voltage Differential Probes -- ADP300/ADP305 108
Differential Probes -- AP031 110
Differential Amplifiers
DA1820A/DA1822A 111
DA1850A/DA1855A 113
DA1820A-PR2/DA1822A-PR2/DA1850A-PR2/DA1855A-PR2 115
Differential Probe Pairs
DXC100A 116
DXC200 117
DXC5100/DA101 118
S
High Voltage Passive Probes -- PPE1.2kV/PPE2000/PPE4000/PPE20kV 119
T
Current Probes
N
CP015/CP150 120
AP011 122
E
AP015 123
T
General-Purpose Accessories 125
N
Instrument Carts 126
O
Carrying Cases 127
C
5 Jitter and Timing Analysis 131
Jitter and Timing Analysis 132
F
Three Views of Jitter 133
O
LeCroy Jitter & Timing Products 138
JitterPro Software Package 138
Clock Certification & Test Module (CCTM) 139
E
Jitter and Timing Analysis (JTA) Package 139
L
Jitter Measurement Specifications 140
B
Jitter Analysis Packages 141
An Introduction to Timing and Jitter Measurements for Phase-Lock
A
Loops and Oscillators 142
T
2
Table of Contents
6 General-Purpose DSO Options 149
Digital Filter Package (DFP) 150
WAVA 151
CKTRIG External Clock and Trigger Output Option 152
ScopeExplorer 153
ActiveDSO 154
7 PowerMeasure Systems 155
Power Measurements Made Easy 156
PowerMeasure Systems Selection Guide 162
Recommended System Components 163
Additional DSO Accessories for Power Measurements 163
PMA1 PowerMeasure Analysis Software 164
Differential Voltage Measurements 165
Current Measurements and Channel Delay Matching 166
Accurate Instantaneous Power Measurements 168
8 Disk Drive Analysis 171
DDA260 172
9 Communications Analyzers 185
MCA1060 Microwave Communications Analyzer 186
10 Telecom Test Solutions 189
Introduction to Telecom Test MT01/MT02/MT03 190
11 Sales and Service 194
Sales Offices Worldwide 198
LeCroy Global Representatives 199
3
CONTENTS
Scope Selection Guide
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WavePro
960 4 2 GHz 4-16 GS/s 250 k/1 M 10.4" TFT
950 4 1 GHz 4-16 GS/s 250 k/1 M 10.4" TFT
940 4 500 MHz 4- 8 GS/s 250 k/1 M 10.4" TFT
Memory Options
M 1 Mpt/ch 4 Mpt maximum
L 4 Mpt/ch 16 Mpt Maximum
VL 8 Mpt/ch 32 Mpt Maximum
XL 16 Mpt/ch 64 Mpt Maximum (Model 960 only)
Waverunner - 2
LT374 4 500 MHz 2-4 GS/s 250 k/500k 8.4" TFT
LT372 2 500 MHz 2-4 GS/s 250 k/500k 8.4" TFT
LT264 4 350 MHz 1 GS/s 100k 8.4" TFT
LT262 2 350 MHz 1 GS/s 100k 8.4" TFT
Memory Options
S
M 1 Mpt/ch; (Models 374 and 264)
L 4 Mpt/ch; (Model 374 only)
L
A
T
Waverunner Scopes
LT364 4 500 MHz 500 MS/s -1GS/s 250 k/500k 8.4" TFT
N
LT364L 4 500 MHz 500 MS/s -1GS/s 1 M/2 M 8.4" TFT
LT344 4 500 MHz 500 MS/s 250 k 8.4" TFT
E
LT344L 4 500 MHz 500 MS/s 1M 8.4" TFT
LT342 2 500 MHz 500 MS/s 250 k 8.4" TFT
LT342L 2 500 MHz 500 MS/s 1M 8.4" TFT
M
LT322 2 500 MHz 200 MS/s 100 k 8.4" TFT
LT224 4 200 MHz 200 MS/s 100 k 8.4" TFT
A
D
Literunner
N
LP142 2 100 MHz 500 MS/s 100 k 5.7" LCD
U
F
4
Digital Oscilloscopes
5
CONTENTS
1
CONTENTS
Fundamentals of Digital Oscilloscopes
and Waveform Digitizing
This technical note discusses
how electronic signals are
measured by data acquisition
instruments and stored as
numbers in fast memory.
Concepts discussed include
data sampling, triggering,
data). Captured waveforms can be resolution, and diagnostic capabilities for
recording pre-trigger data,
expanded to reveal minute details such troubleshooting. Some architectures are
how sampling rate affects
as fast glitches, overshoot on pulses, and optimized for transient signal capture,
usable bandwidth, and how noise.These captured waveforms can be while others only record repetitive
long memory improves analyzed in either the time or frequency signals. A general-purpose instrument
sampling rate. There is also a domains. can capture both single-shot and repet-
brief discussion of diagnostic itive waveforms.
Some oscilloscopes will:
capabilities, including
standard parameters,