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A G R E AT E R M E A S U R E O F C O N F I D E N C E dler, which bins the part and places another
in the fixture. Sequential test is appropriate
when the component handler costs less than
the test equipment.
In the multiplex test method (Figure 2)
the component handler puts multiple compo-
nents in the test fixture at once, and the test
equipment includes a multiplexer to switch
between devices. This increases through-
put--especially if the component handler
can move all components simultaneously, as
with tape-and-reel systems or wafer prober
Choosing a strategy
systems with a multi-site probe card. This
method is appropriate when the test sequence
is short compared to the time required to in-
for component test
dex to the next set of test sites on the wafer or
position the next set of DUTs in the fixture.
automation Parallel and concurrent
Adding multiple test sets allows parallel
test, with all components tested at the same
time (Figure 3). This is good when through-
put is vital and the test sequence execution
Paul Meyer, Keithley Instruments, Inc. time is significant compared to the compo-
nent handler or wafer prober index time--
and especially when the test equipment costs
significantly less than the component handler
Component testing can be done sequentially, the test fixture and signals the test equipment or wafer prober.
in parallel, or in a combination. Here's how to begin the test sequence (Figure 1). Once To accomplish more than about a 2