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2520INT Integrating Sphere for
Pulsed Measurements
The Model 2520INT Integrating Sphere is designed to optimize the
Model 2520 Pulsed Laser Diode Test System's optical power measurement
capabilities . It allows the testing of devices with pulse widths as short as
500ns . The short pulses of the Model 2520 combined with the speed of the
Model 2520INT make them ideal for measuring the optical power of laser
diodes at the bar or chip level, before these devices are integrated into
temperature-controlled modules . When connected to the Model 2520 via a
Simplifies pulsed measurements of optical power
low noise triax cable, the Model 2520INT allows the Model 2520 to make
direct, high accuracy measurements of a laser diode's optical power . The
results are expressed in milliwatts .
Designed specifically for Pulsed laser Diode Testing
Keithley developed the Model 2520INT to address the challenges specific
to pulse testing laser diodes, which include short pulse periods and fast
rise times . For example, when testing laser diodes in pulse mode, the opti-
cal head used must provide a response that's fast enough to measure light
pulses as short as 500ns . Many optical power detectors are hampered by
long rise times, so they can only measure a portion of the laser diode's
light output . Even when using a "fast" detector, many detectors are not
good for analog signal measurement . By linking the Model 2520 with the
optimum combination of sphere and detector characteristics, Keithley
provides the low-level sensitivity needed to ensure accurate pulse measure-
ments .
Easier laser Diode Power Measurements
An integrating sphere is inherently insensitive to variations in the beam
profile produced by a device under test (DUT) . The Model 2520INT's