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2520 Pulsed Laser Diode Test System
The Model 2520 Pulsed Laser Diode Test System
is an integrated, synchronized system for testing
laser diodes early in the manufacturing process,
when proper temperature control cannot be
easily achieved . The Model 2520 provides all
sourcing and measurement capabilities needed
for pulsed and continuous LIV (light-current-
voltage) testing of laser diodes in one compact,
half-rack instrument . The tight synchronization
Multi-channel pulsed test of laser diodes
of source and measure capabilities ensures high
measurement accuracy, even when testing with
pulse widths as short as 500ns .
lIV Test Capability
The Model 2520 can perform pulsed LIV testing
up to 5A and continuous LIV testing up to 1A .
Its pulsed testing capability makes it suitable for
testing a broad range of laser diodes, including
the pump laser designs for Raman amplifiers .
The instrument's ability to perform both DC and
pulsed LIV sweeps on the same device simplifies
analyzing the impact of thermal transients on