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Characterization of Frequency
Agile Sources
Rex Chappell
Santa Clara Division
RF & Microwave
Measurement
Symposium
and
Exhibition
FliDW HEWLETT
~~ PACKARD
www.HPARCHIVE.com
ABSTRACT:
This paper describes techniques for testing fast-switching frequency-agile sources, such as frequency hopping
radios and synthesizers. Using the new HP 5371A Frequency and Time Interval Analyzer, dynamic, at-speed
testing of these devices is now possible. Single-pass characterization techniques for five important device
parameters will be discussed; 1) hopping sequency analysis, 2) switching transient analysis, 3) settling time
verification, 4) hopping frequency distribution, and 5) carrier modulation analysis.
AUTHOR:
Rex Chappell, Product Marketing Engineer for Universal Counters, Santa Clara Division, BSEE, San Jose
State, 1970. With HP since 1973 in various marketing positions: RSE, Product Support, European Sales
Development Engineer, Logic Test PME, and Universal Counters PME since 1985.
www.HPARCHIVEcom
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"" This paper will cover new techniques and tools for char-
acterizing frequency-agile source parameters that were
previously difficult or impossible to quantify.
Characterization of
Frequency Agile Sources
Rex Chappell
Santa Clara Division
For the purposes of this paper, a frequency-agile source
will be dermed as a source that changes its output fre-
Agile Carrier quency in a serial way with time. An example is a veo
that is driven by a series of voltage steps.
Time Dom"i