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application brief
Achieving Fast Pulse Measurements
for Today's High Power Devices
Green initiatives and energy efficiency standards worldwide have motivated engineers to find ways to design more efficient
semiconductor devices and integrated circuits, and measuring the true state of these devices without the effects of self-heating
is critical. Test instruments with only DC capability can deliver enough power to a device to cause heat dissipation that alters
its characteristics. Pulsed characterization is a solution to this issue.
The use of a pulsed stimulus demands faster measurements. Traditional precision SMUs (source-measure units) use integrating
ADCs. Although it offers the advantage of high accuracy and excellent noise immunity, this ADC technology does not lend itself
to high speed digitization or waveform capture. For applications that require these capabilities, Keithley's Model 2651A High
Power SourceMeter