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appl icat i ons gui de
DC I-V Testing for Components and
Semiconductor Devices
a g r e a t e r m e a s u r e o f c o n f i d e n c e
DC I-V Testing for Components and Semiconductor Devices
DC I-V measurements are the cornerstone of device and material testing. This DC I-V testing applications
e-guide features a concentration of application notes on DC I-V testing methods and techniques using
Keithley's Model 4200-SCS Parameter Analyzer. The Model 4200-SCS provides a wide range of I-V
measurements including sub-pA leakage measurements and