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Number 2846
A Tektronix Company
ACS Integrated Test System for
Application Note Lab-Based Automation
Series
Introduction
As time to market and cost of test pressures mount, efficiency
of tool usage and test engineer productivity continue to be
scrutinized. Increased automation is a common way to better
leverage resources. The progression from single die testing on
manual probers to single wafer testing with semi-automatic
probers naturally leads to full cassette probing on automatic
probers. Doing this kind of testing with the precision and
flexibility of laboratory-based tools, but without the expense of
production parametric test systems, has been difficult in the past.
It usually encompassed significant amounts of custom code and
specialized test stands as well as highly trained engineers to run
the equipment. Keithley has the solution. Combining Keithley's
Automated Characterization Suite (ACS) software with the Model
4200-SCS Parameter Analyzer provides the best of both worlds--
lab-level characterization and production automation.
Industry-Leading Lab Characterization
The Model 4200-SCS has been a leading tool in semiconductor
labs for a variety of characterization and modeling tasks.
Typical applications include standard DC I-V and C-V testing of
test structures and devices like BJTs, FETs, and diodes. Multi-
Figure 1. Example Model 4200-SCS running ACS and controlling a
channel source capabilities up to 1A and 200V and measurement switch matrix.
resolution down to 100 atto-Amps and 1