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Jitter Fundamentals:
Jitter Tolerance Testing with Agilent
81250 ParBERT
Application Note
Introduction
This document allows
designers of medium complex
digital chips to gain fast and
efficient insight into the
operation and performance of
CDR, clock system and jitter
tolerance. This type of testing
is different to conformance
testing and manufacturing test;
this type of testing targets fast
and efficient results on GO