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A GREAT ER M EA SU R E O F C O N F I D E N C E alized, the packaged devices are exposed to
target analytes, and their detection charac-
teristics analyzed.

Wafer Level Testing
In wafer level testing, Id-Vd and Id-Vg
measurements are taken at various stages of
production. The tests are conducted on ac-
tual devices and special test structures. The
test equipment includes a semi-automatic
prober, Keithley Model 2400 SourceMeter