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Reliability "Bathtub Curve"
A G R E AT E R M E A S U R E O F C O N F I D E N C E
Failure Lifetime
Rate Failure
Area
Time
Figure 1. Typical semiconductor reliability
curve.
Stress-measure testing is a common tech-
nique used to evaluate operating lifetimes
Wafer Level Reliability
and wear-out failure mechanisms in semi-
conductor devices. This testing is focused
on failures on the right side of the typical
Testing