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S680dc/rF RFOptionforS680SeriesTesters
MakingcomplexRFmetrologysimplesince2002
High Performance Single-Insertion
rF and dc Test Solution
Keithley's S680DC/RF Test System is designed to speed and simplify
measuring RF parameters in concert with DC parametric testing. This sys-
tem integrates DC and RF parametric testing capabilities in a single auto-
mated tester, allowing independent DC and RF test execution when used
with a suitable test structure layout. The S680DC/RF system adds 2-port
s-parameter measurement capabilities to Keithley's S680 Series Automated
Parametric Test Systems, one of the most versatile and widely accepted DC
Speed and simplify DC and RF testing
test platforms available.
The measurement capabilities built into the S680DC/RF system were
defined in cooperation with leading manufacturers of telecommunications
components, many of whom employ Keithley test systems in their wafer
fabrication facilities. To meet their requirements, Keithley has formed
working partnerships with two companies at the cutting edge of RF test
technology-- Anritsu Corporation, a leading producer of Vector Network
Analyzers (VNAs), and GGB Industries, Inc., the foremost maker of com-
bined DC/RF probe cards.
The S680DC/RF Test System is targeted at the technology development
testing needs of a fab's modeling and process integration engineering
departments as well as manufacturing test operations. It offers an eco-
nomical wafer level testing approach to handling the growing demand for
wireless and telecom devices.
dramatic reductions in coT
The S680DC/RF Systems offer fabs producing components for telecom-