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A G R E AT E R M E A S U R E O F C O N F I D E N C E Technology and Economics Drive
Testing Needs
Accelerated testing such as HCI and
NBTI can quickly generate curves that are
extrapolated to predict operating lifetime
and thereby provide insight into device de-
sign and manufacturing processes. The most
Short Pulse Testing
efficient method is to over-stress the device,
measure degradation trends of key operating
parameters, and extrapolate the data to the
Mandatory for
full lifetime (Figure 1).
However, it doesn't help if the extrapola-
tion isn't representative of the way a device
Semiconductor is going to be used. For example, NBTI deg-
radation can relax when gate voltage stress is
Reliability
turned off. Then drain current and threshold
voltage may recover and change back toward
their original values