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New Test Methods for the r&d Lab
Learn how to solve 2009's toughest
electrical measurement problems
w w w. k e i t h l e y. c o m a g r e at e r m e a s u r e o f c o n f i d e n c e
f e at u r e d a p p l i c at i o n
optimize your low current measurements
For applications like determining the gate leakage current of FETs or
testing sensitive nanoelectronic devices, you need to measure
picoamps of current or less with high accuracy. To make these
measurements successfully, you'll not only need a very sensitive
ammeter but the knowledge to choose the proper measurement
settings, select low noise fixtures and cabling, allow sufficient settling
time, and use techniques that prevent unwanted currents from
reducing accuracy. Learn more.
Learn how to make better low current measurements
faster. Read our online application note.
Shielded vs. unshielded measurements
on a 100G resistor
Need advice on your application?
n Click here or
n Email [email protected]
VIEW THE WEBINAR:
How to Get the Most from Your
Low Current Measurement Instruments
v i e w a p p L i c at i o n n o t e view our onLine webinar emaiL us
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simplify your low current measurements
with the model 4200-ScS
d o w n L o a d t e c h n i c a L d ata b o o k emaiL us
The Model 4200-SCS Semiconductor Characterization
System delivers best-in-class DC, CV, and pulse device
characterization, real-time plotting, and analysis with
high precision and sub-femtoamp resolution. Its self-
documenting, point-and-click interface speeds and
simplifies taking data, so you can start analyzing your
results sooner.
n Remote preamps extend current measurement
resolution to 0.1fA.
n High speed, high precision A/D converter for each DC
channel eliminates measurement tradeoffs.
Need more details about the Model 4200-SCS?
download the Model 4200-SCS Semiconductor
Characterization System Technical Data Book
Ready to request a quote or place an order?
Call 1-800-492-1955 and
modeL 4200-scs current measurement performance with optionaL remote preamps
n Press 1 to place an order, or email
[email protected] current range maX voLtage
measure
resoLution accuracY
n Press 2 to speak to an inside sales person,
or email [email protected] 10 nA 210 V 10 fA 0.050 % + 1 pA
1 nA 210 V 3 fA 0.050 % + 100 fA
100 pA 210 V 1 fA 0.100 % + 30 fA
10 pA 210 V 0.3 fA 0.500% + 15 fA
1 pA 210 V 100 aA 1.000% + 10 fA
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f e at u r e d a p p l i c at i o n
characterize your sample's resistivity and hall voltage
The resistivity of semiconductor devices can affect their
capacitance, series resistance, and threshold voltage. For
materials testing, you may want to use a four-point probe
technique to determine resistivity because it eliminates
measurement errors due to the probe resistance, the
spreading resistance under each probe, and the contact
resistance between each metal probe and the
semiconductor material. Learn more.
Four-point probe project for resistivity measurements
discover how to use hall voltage
measurements to derive a sample's
conductivity type, carrier density, and
hall mobility -- view our free online
application note now.
Need advice on your application?
n Click here or
n Email [email protected]
VIEW THE WEBINAR: Hall Effect Measurements Fundamentals
v i e w a p p L i c at i o n n o t e view our onLine webinar emaiL us
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improve the accuracy of your resistivity measurements
with the model 4200-ScS
down Load b roch u r e emaiL us
The Model 4200-SCS supports both the four-point collinear
probe method and the van der Pauw method of determining
resistivity. Its high input impedance (>1016), accurate low
current sourcing, and optional remote preamps make it ideal
for characterizing high resistance samples.
n Supports measuring resistances >1012
n No external switching required, eliminating leakage
and offsets errors due to mechanical switches
n No external instruments required
Built-in support for van der Pauw resistivity testing
Model 4200-SCS systems can be configured with
up to nine Source-Measure Units (SMUs), in any
combination of medium- and high-power versions.
to find out what your old parameter analyzer
has been missing, download the
Model 4200-SCS brochure
Ready to request a quote or place an order?
Call 1-800-492-1955 and
n Press 1 to place an order, or email
maX. voLtage maX. current maX. power
[email protected]
4200-smu 210 V 100 mA 2w
n Press 2 to speak to an inside sales person, medium power
or email [email protected] 4210-smu
high power 210 V 1A 20 w
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f e at u r e d a p p l i c at i o n
enhance solar/photovoltaic cell efficiency with i-v and c-v testing
To characterize solar/PV cells, you may need to
measure current and capacitance as a function of
an applied DC voltage at various light intensities
and temperature conditions. Important device
parameters such as conversion efficiency and
maximum power output can be extracted from
current-voltage (I-V) and capacitance-voltage (C-
V) measurements, as well as information on
losses in the PV cell. Learn more.
Idealized equivalent circuit of a photovoltaic cell learn about the basic principles
of PV cells, test connections,
and sources of error.
Download our free online
application note
Need advice on your application?
n Click here or
n Email [email protected]
VIEW THE WEBINAR:
Photovoltaic Measurements: Testing the Electrical Properties of Today's Solar Cells
v i e w a p p L i c at i o n n o t e view our onLine webinar emaiL us
w w w. k e i t h l e y. c o m a g r e at e r m e a s u r e o f c o n f i d e n c e
optimize the efficiency of your solar cells
with the model 4200-ScS
d o w n L o a d k t e i v 7. 2 b r o c h u r e down Load soL ar ceLL test b roch u r e emaiL us
Nine new test libraries expand the Model
4200-SCS's capabilities for solar cell I-V, C-V,
and resistivity testing applications. They are
applicable to the most popular solar cell
technologies, including mono-crystalline, poly-
crystalline, amorphous, copper indium gallium
selenide (CIGS), cadmium telluride (CdTe),
and polymer organic technologies.
to learn more about the latest
enhancements to our solar/pv cell
testing capabilities, download our
new brochures:
n KTEI V7.2 - expand your SPA
Applications and your chassis
soLar/pv ceLL parameters provided:
n Simplify your Solar Cell Short-circuit current (iSc)
Testing with keithley's Precision open-circuit voltage (Voc)
measurement Solutions maximum power output (Pmax)
Fill Factor (ff)
Voltage at maximum power measured at angle of incidence (Vmp)
Ready to request a quote or place an order? current at maximum power measured at angle of incidence (imp)
Call 1-800-492-1955 and Rshunt
Rseries
n Press 1 to place an order, or email [email protected]
Resistivity
n Press 2 to speak to an inside sales person, defect density
or email [email protected] doping density
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f e at u r e d a p p l i c at i o n
take the pulse of your semi devices
Using pulsed rather than DC signals to characterize
devices allows you to eliminate or study the effects of
device self-heating (joule heating). Pulse I-V testing also
supports time-domain studies, such as transient charge
trapping in the device under test (DUT). Learn more.
Support for pulse I-V testing of both nMOS and pMOS devices
discover how to make common
parametric transistor tests like VdS-id and
VGS-id more efficiently. Read our free
online application note.
Need advice on your application?
n Click here or
n Email [email protected]
VIEW THE WEBINAR:
Pulsed Characterization of Advanced CMOS Technologies
v i e w a p p L i c at i o n n o t e view our onLine webinar emaiL us
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help your transistors keep their cool
with th e model 4200-ScS with P u lSe i-V oPtion S
c aLL 1-800-492-1955 emaiL us
The Model 4200-SCS offers three hardware/software
options for specific sets of pulse test applications:
n 4200-PIV-A Pulse I-V Package