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File name: | 1281_metrology.pdf [preview 1281 metrology] |
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File name 1281_metrology.pdf This paper was first presented at the National Conference of Standards Laboratories `97, Atlanta, Georgia, USA, on July 28, `97. Getting the Best out of Long Scale DMMs in Metrology Applications Peter B. Crisp Wavetek Ltd Introduction Long-scale multifunction DMMs now have the accuracy, resolution and stability to be used in a wide range of metrology applications. This paper describes how one such DMM can be used as an alternative to traditional equipment such as Null Detectors, Kelvin-Varley dividers, and Resistance Bridges. Practical examples are provided, together with a discussion of the precautions that need to be taken to ensure optimum performance, the uncertainties that can be achieved and the relative ease of use compared with traditional methods. DMM Technology For the purposes of this paper, a long scale DMM is defined as having an available resolution of up to 8 |
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