Agilent English 2013-01-07 PDF 1.65 MB 5990-6993EN c20130107 [5] free download

File name English _ 2013-01-07 _ PDF 1.65 MB 5990-6993EN c20130107 [5].pdf

Diode Production Test Using the Agilent B2900A Series of SMUs Technical Overview Agilent B2901/02/11/12A Precision Source/Measure Unit Agilent B2901A Precision SMU, 1ch, 100 fA resolution, 210 V, 3A DC/10.5 A pulse Agilent B2902A Precision SMU, 2ch, 100 fA resolution, 210 V, 3A DC/10.5 A pulse Agilent B2911A Precision SMU, 1ch, 10 fA resolution, 210 V, 3A DC/10.5 A pulse Agilent B2912A Precision SMU, 2ch, 10 fA resolution, 210 V, 3A DC/10.5 A pulse Introduction source and measure both voltage and current. They cover currents To ensure compliance with manu- from 10 fA to 3 A (DC)/10.5 A (pulse) facturing specifications, single-point and voltages from 100 nV to 210 V. pass/fail DC testing must be per- In addition to these comprehensive formed on packaged diodes. Because measurement capabilities, the these tests are also used to identify B2900A Series of SMUs possesses and remove defective devices before high throughput that reduces test shipment, their reliability is important times. The B2900A Series of SMUs to guarantee product quality. In addi- also has many features that make it tion, it is also essential to perform the well-adapted for production test, such tests quickly to keep the production as pass/fail binning, a digital I/O throughput high. interface for handler control, and code compatibility with standard single and Agilent B2901/02/11/12A Precision dual channel SMU products. Source/Measure Unit meets all of these requirements, making it the This technical overview shows how best solution for diode production to use the B2900A Series of SMUs for test. It is a compact and cost- production test. A simple diode test effective bench-top Source/Measure example will be shown for a forward Unit (SMU) with the capability to voltage test (VF). Easy production test Program memory For tests that utilize lots of repeated code (such as subroutines), program system configuration improves throughput memory can dramatically reduce test Figure 1 shows a conceptual diagram Fast test times are essential to times. Of course, programs can be of a system based on the B2900A maximize throughput and maintain saved to or loaded from any attached Series of SMUs for production diode high levels of factory productivity. USB flash memory device (please see test. The widely available banana Besides possessing fast intrinsic Figure 2). style terminals of the B2900A Series measurement speed, the B2900A of SMUs greatly simplify the test Series of