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File name: | 5992-0141EN English _ 2014-10-09 _ PDF 753 KB c20141009 [8].pdf [preview 5992-0141EN English 2014-10-09 PDF 753 KB c20141009 [8]] |
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Mfg: | Agilent |
Model: | 5992-0141EN English 2014-10-09 PDF 753 KB c20141009 [8] 🔎 |
Original: | 5992-0141EN English 2014-10-09 PDF 753 KB c20141009 [8] 🔎 |
Descr: | Agilent 5992-0141EN English _ 2014-10-09 _ PDF 753 KB c20141009 [8].pdf |
Group: | Electronics > Other |
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File name 5992-0141EN English _ 2014-10-09 _ PDF 753 KB c20141009 [8].pdf Keysight N7020A Power Rail Probe for Power Integrity Measurements The Right Tool for the Right Job Data Sheet 02 | Keysight | N7020A Power Rail Probe for Power Integrity Measurements - Data Sheet The need for a specialized power integrity probe Would you like to minimize oscilloscope and probe noise when measuring DC power rails? Do you need more offset than is available in your oscilloscope so you can zoom-in to view and analyze small signals on top of DC power supplies? Would you like to have input impedance greater than 50 at DC so your oscilloscope doesn't load your DC power rails? Do you need more bandwidth so you can track down transients on your DC power supplies that can adversely affect your clock and data? If so, the N7020A power rail probe is the right tool for the job. Developed specifically to help engineers with precise DC power rail testing, the N7020A power rail probe was designed to minimize noise and maximize the offset range of the measurement system while providing high bandwidth and low target loading. The challenge The increased functionality, higher density, and higher frequency operation of many modern electronic products has driven the need for lower supply voltages. It is common in many designs today to have 3.3, 1.8, 1.5 and even 1.1V DC supplies--each of them having tighter tolerances than in previous product generations. Engineers need to zoom-in on power rails to look for transients, measure ripple, and ana- lyze coupling. An oscilloscope often does not have enough offset to be able to shift the DC power rail to the center of the screen for the required measurements. Placing a DC blocking capacitor in the signal path eliminates the offset problem but also eliminates relevant DC information such as DC supply compression or low frequency drift. A low noise measurement solution is of paramount importance so it doesn't confuse the noise of the probe and oscilloscope with the noise and ripple of the DC supply being measured. Using probes (active or passive) that are higher than 1:1 attenuation can help with the offset difficulty but will also decrease the signal-to-noise ratio and negatively affect measurement accuracy. Using the oscilloscope's 50 input with a passive coaxial cable offers a 1:1 attenuation ratio probing method but results in higher-than-desired DC loading of the supply being measured and has the offset limitations mentioned earlier. Ripple, noise, and transients riding on DC supplies are a major source of clock and date jitter in digital systems. Dynamic loading of the DC supply by the processor, memory, or similar items occurs at the clock frequency and can create high speed transients and noise on the DC supply. Designers need high-bandwidth tools to evaluate and under- stand high-speed noise and transients on their DC power rails. Using the N7020A power rail probe, with 2 GHz bandwidth and 50 K DC resistive loading, to see the AC and DC components of a |
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