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File name: | ADS W2302EP ET_252C W2500EP ET_252C and W2312EP ET Transient Convolution Products 5990-3571EN [5].pd [preview ADS W2302EP ET 252C W2500EP ET 252C and W2312EP ET Transient Convolution Products 5990-3571EN [5]] |
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Model: | ADS W2302EP ET 252C W2500EP ET 252C and W2312EP ET Transient Convolution Products 5990-3571EN [5] 🔎 |
Original: | ADS W2302EP ET 252C W2500EP ET 252C and W2312EP ET Transient Convolution Products 5990-3571EN [5] 🔎 |
Descr: | Agilent ADS W2302EP ET_252C W2500EP ET_252C and W2312EP ET Transient Convolution Products 5990-3571EN [5].pdf |
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File name ADS W2302EP ET_252C W2500EP ET_252C and W2312EP ET Transient Convolution Products 5990-3571EN [5].pd Agilent EEsof EDA W2302EP/ET Advanced Design System Transient Convolution Element W2500EP/ET Transient Convolution GT Option W2312EP/ET Transient Convolution Distributed Computing 8-pack Figure 1. Eye diagram results from the ADS Transient-Convolution Simulator show excellent correlation with measurements, enabling rapid "what if" design space exploration. Agilent EEsof EDA--the technology and innovation leader in high-speed, high-frequency electronic design automation--takes SPICE to a new level with the ADS Transient Convolution Element. This simulator is the industry's fastest signal integrity circuit simulator for multigigabit, high-speed data link design. Multicore processor support and a new, high-capacity sparse matrix solver achieves a three-fold simulation speed improvement for signal integrity simulations. Design and verification of chip-to-chip multigigabit/s serial links is the morst common application for the Transient Convolution Element. At the very high data rates at which these links operate, signal integrity engineers must take into account physical phenomena such as impedance mismatch, reflections, electromagnetic coupling, crosstalk and microwave frequency attenuation due to the skin effect and dielectric loss tangent. The simulator allows signal integrity engineers to perform "what-if" design space exploration using a circuit-level model that can be verified against measured data, and electromagnetic simulation on the post-layout artwork to arrive at an optimum design while avoiding costly and time consuming prototype iterations. W2302EP/ET Transient Convolution Element The Transient Convolution Element includes: |
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