File information: | |
File name: | Permittivity and Dielectric Loss Tangent Measurement System for Millimeter Wave for sheet and ultra- [preview Permittivity and Dielectric Loss Tangent Measurement System for Millimeter Wave for sheet and ultra-] |
Size: | 1389 kB |
Extension: | |
Mfg: | Agilent |
Model: | Permittivity and Dielectric Loss Tangent Measurement System for Millimeter Wave for sheet and ultra- 🔎 |
Original: | Permittivity and Dielectric Loss Tangent Measurement System for Millimeter Wave for sheet and ultra- 🔎 |
Descr: | Agilent Permittivity and Dielectric Loss Tangent Measurement System for Millimeter Wave for sheet and ultra- 5991-1214EN c20140805 [2].pdf |
Group: | Electronics > Other |
Uploaded: | 26-07-2021 |
User: | Anonymous |
Multipart: | No multipart |
Information about the files in archive: | ||
Decompress result: | OK | |
Extracted files: | 1 | |
File name Permittivity and Dielectric Loss Tangent Measurement System for Millimeter Wave for sheet and ultra- Keysight Technologies and KEYCOM Corp. Permittivity and Dielectric Loss Tangent Measurement System for Millimeter Wave for sheet and ultra-thin sheet System No. DPS03 Network Analyzer Specifications GPIB cable Frequency: 18~110GHz Fabry-Perot resonator Permitivity: 1.05~30 Sample (Accuracy: +- 3%) tan: 0.0001~0.05 (Accuracy: +- 7%) Specimen size: 70mm x 70mm min. (18GHz) 30mm x 30mm min. (50GHz) Control device Specimen thickness: 5um ~ 0.2mm or Supports specimens as thin as 5 |
Date | User | Rating | Comment |