Agilent 5991-4713EN Materials Measurement Dielectric Materials - Application Brief c20140717 [5] free download

File name 5991-4713EN Materials Measurement_ Dielectric Materials - Application Brief c20140717 [5].pdf

Keysight Technologies Materials Measurement: Dielectric Materials Application Brief 02 | Keysight | Materials Measurement: Dielectric Materials - Application Brief Overview Solution Increasing capability and performance of electronic equipment The parallel plate method uses two electrodes between which are supported by the development of new devices, which in turn the material under test is sandwiched. The impedance of the is enabled by progress in material science and process technolo- material is measured and converted to the complex permittivity gies. using the size of the material and the electrodes. Dielectric materials play a key role in electronic circuits such as capacitors or insulators. Characterization of these materials in the early stage of development is essential to predict the perfor- mance of the final devices. The electrical properties of a dielectric material are character- ized by its complex permittivity. The real part of permittivity, also called dielectric constant, represents the material's ability to * =r '- jr " store energy when an external electric field is applied. Materials CP t CP