Agilent 5991-2375EN Using Microwave Switches When Testing High Speed Serial Digital Interfaces c20140905 [28 free download

File name 5991-2375EN Using Microwave Switches When Testing High Speed Serial Digital Interfaces c20140905 [28

Keysight Technologies Using Microwave Switches When Testing High Speed Serial Digital Interfaces Application Note 02 | Keysight | Using Microwave Switches When Testing High Speed Serial Digital Interfaces - Application Note Many high speed digital interfaces Lane0 + use multiple lanes to achieve the throughput requirements of their Lane0 - systems. These systems present Lane1 + validation and characterization Lane1 - LaneTest + challenges because of connection LaneTest - requirements, including single- ended as well as differential LaneN + testing and more lines than LaneN - oscilloscope channels available. Solving this problem with a switching network will lead to Figure 1. Two multi-port microwave switches can be used to switch high speed lower test costs, higher reliability, differential lanes and unattended testing, which managers desire for productivity. This application note addresses There are two primary use cases that will be addressed in this application note. These the use of these switching are identified by the nature of the device under test and, as you will see, determine networks, their calibration, use different steps in the calibration of an intervening network. of calibration, accuracy that is achievable, degradations that Case #1 might be encountered, and Device under test is an integrated circuit, and the objective is to measure to the pins other considerations such as of the device. A printed circuit (PC) board is used as test fixture. It breaks out signals de-embedding test point access to test to standard RF connectors such as SMA. adaptors and 2-port versus 4-port characterization. Switching Use Test board Cases Addressed L0+ L0- Comments about Case #1 L1+ Device L1- The PC board should use the best under materials possible and may (or test L2+ Lane