Agilent Time Dependent and High-Speed Measurements 5-Time Dependent Highspeed Measurement c20130117 [1] free download

File name Time Dependent and High-Speed Measurements 5-Time_Dependent_Highspeed_Measurement c20130117 [1].pdf

Excerpt Edition This PDF is an excerpt from Chapter 5 of the Parametric Measurement Handbook. The Parametric Measurement Handbook Third Edition March 2012 Chapter 5: Time Dependent and High-Speed Measurements "Experience is something you don't get until just after you need it." -- Anonymous Introduction One of the most prominent trends in parametric test is the movement away from simple sweep and spot measurements (where measurement time is not an important part of the measurement) to measurements where the speed at which the measurement must be made is critical to the accuracy of the measurement. In some cases this requires new types of measurement modules other than SMUs, or even the integration of external instruments (pulse generators, oscil- loscopes, etc.) with the parametric measurement equipment. However, some of the newer parametric instruments (such as the Agilent B1500A and B1505A) can make some impressive time sampling measurements just with their SMUs, so it is worthwhile to spend some time discussing all of the available measure- ment options. Parallel measurement with SMUS Parallel measurement is an important capability for all time dependent testing done with SMUs. True parallel measurement with SMUs is only possible when each SMU has its own analog-to-digital converter (ADC) available to it. The Agilent parametric instruments with this capability are the E5270B, the B1500A and the B1505A. For all of these instruments (except the E5260A Series), you can select either a shared high-resolution (HR) ADC or a per-SMU high-speed (HS) ADC for all of the various types of IV measurements as shown below. High-speed A ADC V High-speed A High-resolution ADC ADC V