Agilent 5991-3184EN Current Sensing AFM Measurements Using 7500 AFM - Application Note c20141020 [2] free download

File name 5991-3184EN Current Sensing AFM Measurements Using 7500 AFM - Application Note c20141020 [2].pdf

Keysight Technologies Current Sensing AFM Measurements Using 7500 AFM Application Brief Introduction universal scanner operating in both Open-loop and Closed-loop mode. Current Sensing Atomic Force Microscopy Switching imaging modes with the (CSAFM) is an extended SPM mode for Keysight 7500 AFM/SPM microscope simultaneously probing the conductivity is quick and convenient, a result from and topography of a sample. It takes the scanner's interchangeable, easy- the combined advantage of scanning to-load nose cones. All 7500 AFM's tunneling microscopy and force micros- come with the lowest noise closed copy, making it capable of studying loop position detectors to provide the localized electric properties of resistive ultimate convenience and performance samples. CSAFM utilizes electrically in imaging, without sacriicing resolution conductive AFM cantilevers and and image quality. operates in standard contact mode. By applying a voltage bias between the The Keysight 7500 microscope with the substrate and the conducting cantilever, addition of a preamp, and the standard a current is generated. This current can nosecone enables CSAFM mode. be used to construct a spatially resolved Preamps are available in three different conductivity image. It also allows for sensitivity settings of 0.1nA/V, 1nA/V, Metroscanner (top) and preamp board (bottom). local current vs. voltage measurements and 10nA/V, yielding current ranges of (I/V) with purely topographic feedback.