Agilent Oscilloscopes in Manufacturing Test Pass fail mask testing speeds up automated testing 5990-9176EN c free download

File name Oscilloscopes in Manufacturing Test Pass fail mask testing speeds up automated testing 5990-9176EN c

Oscilloscopes in Manufacturing Test Pass/fail mask testing speeds up automated testing Agilent's InfiniiVision 2000, 3000 or 4000 X-Series oscilloscopes can be optionally configured with the industry's only hardware-based pass/fail mask testing capability to achieve fast and reliable test results in the manufacturing test environment. Shipping reliable electronic products today often requires that various signals within products be tested under automated control to insure that they meet minimum internal and/or external specified requirements. The primary instrument used to test the parametric/analog characteristics of signals is typically a digital storage oscilloscope (DSO). Most of today's DSOs are fully programmable and come with downloadable IVI drivers. Whatever measurements that can be manually performed on the bench, can usually be performed under automated control. When selecting a scope for the manufacturing test environment, the most important characteristics of multiple characteristics of captured waveforms can be the scope are accurate test results, fast test results, and tested using a single mask. Rather than testing against statistically reliable test results. a specific parameter, such a peak-to-peak voltage, mask testing will test the overall shape of a waveform that may Although one method of testing is to transfer waveform include Vpp, rise time, pulse width characteristics, as well arrays captured by the oscilloscope to a computer for as maximum allowable noise. further data crunching, a more efficient method is to let the oscilloscope do the data crunching, and then just transfer the results. Most of today's DSOs include built-in parametric measurement capabilities such as rise time, amplitude, and frequency measurements. Perhaps the only test requirement is to determine whether or not a digital signal meets a minimum rise time specification. Simply transfer the measured numeric rise time value and then compare the results against the specification. Another method of automated waveform testing is pass/ fail mask testing as shown in Figure 1. With built-in oscilloscope mask testing, pass/fail limit bands are either established within or transferred to the scope. Captured Figure 1: Mask testing can test multiple wave shape parameters waveforms are then quickly compared against the limit at once including maximum allowable noise. bands (the mask). One advantage of mask testing is that Another advantage when using the mask test capability in Agilent's InfiniiVision X-Series oscilloscopes is their ability to provide statistically reliable test results faster than other scopes in the industry. With the oscilloscope industry's only hardware-based mask testing, the 3000 and 4000 X-Series scopes can test an