Agilent Fast fT-Ic Measurement Using the Keysight B2912A 5990-6895EN c20130107 [5] free download

File name Fast fT-Ic Measurement Using the Keysight B2912A 5990-6895EN c20130107 [5].pdf

Fast fT-Ic Measurement Using the Agilent B2900A Series of SMUs Technical Overview Agilent B2901/02/11/12A Precision Source/Measure Unit Agilent B2901A Precision SMU, 1ch, 100 fA resolution, 210 V, 3A DC/10.5 A pulse Agilent B2902A Precision SMU, 2ch, 100 fA resolution, 210 V, 3A DC/10.5 A pulse Agilent B2911A Precision SMU, 1ch, 10 fA resolution, 210 V, 3A DC/10.5 A pulse Agilent B2912A Precision SMU, 2ch, 10 fA resolution, 210 V, 3A DC/10.5 A pulse Introduction The cutoff frequency (fT) is an important parameter to understand the operating frequency range of a System Configuration through a bias-T (either built-in to the network analyzer or external) to bipolar transistor. To measure fT, a Figure 1 shows a system configura- the RF ports of the network analyzer DC bias must be applied to place the tion to perform fT-Ic measurement and to the DC output terminals of the transistor at the correct operating using the B2902A or B2912A dual B2900A Series of SMUs. point while simultaneously using channel SMU in conjunction with a a network analyzer to measure its network analyzer (such as one from The DC bias voltage or current of the frequency characteristics. the Agilent ENA or PNA series). B2900A Series of SMUs is applied to The bipolar transistor is connected the DUT through the bias-T. The Agilent B2901/02/11/12A Precision Source/Measure Unit is a compact and cost-effective bench-top B2912A Source/Measure Unit (SMU) that supplies precise sourcing and mea- Output 1 B2902A or surement capability at a very reason- Output 2 PC B2912A able price. In addition, the B2900A Series of SMUs supports enhanced External trigger trigger functions that enable each GPIB, LAN or USB step of a bias sweep it performs to be synchronized with a frequency sweep