Keithley 2781 Feel for the Pulse free download

File name 2781 Feel for the Pulse.pdf

A G R E AT E R M E A S U R E O F C O N F I D E N C E etries, new materials, and more complex designs are having a tremendous impact on device lifetimes due to increased fragility, higher power density, and new failure mech- anisms. This need is driven in part by the higher operating speeds of today's electronic circuits. The higher operating speed requires test equipment that can produce simulated clock and data signals at the rate that the cir- cuit will actually perform. Also, analog components used in these circuits behave differently at higher speeds, so they can't be characterized at DC using traditional DC methods. Because pulse sizes can be made extremely small, on the order of a few nanoseconds, pulse testing over- comes the problems inherent in DC testing techniques. Therefore, pulsed test signals are needed to characterize these components. A Feel for the Pulse In addition, as components have become smaller, the need for pulsed test