Agilent LIV Test of Laser Diode Using the Keysight B2912A 5990-7115EN c20130107 [5] free download

File name LIV Test of Laser Diode Using the Keysight B2912A 5990-7115EN c20130107 [5].pdf

LIV Test of Laser Diode Using the Agilent B2900A Series of SMUs Technical Overview Agilent B2901/02/11/12A Precision Source/Measure Unit Agilent B2901A Precision SMU, 1ch, 100 fA resolution, 210 V, 3 A DC/10.5 A pulse Agilent B2902A Precision SMU, 2ch, 100 fA resolution, 210 V, 3 A DC/10.5 A pulse Agilent B2911A Precision SMU, 1ch, 10 fA resolution, 210 V, 3 A DC/10.5 A pulse Agilent B2912A Precision SMU. 2ch, 10 fA resolution, 210 V, 3 A DC/10.5 A pulse Introduction High force High force The light-current-voltage (LIV) sweep test is a fundamental measurement Low force Low force LD PD to determine the operating character- istics of a laser diode (LD). In the LIV test, current applied to the laser diode is swept and the intensity of the resulting emitted light is measured using a photo detector (PD). Ch1 Ch2 The Agilent B2901/02/11/12A B2902A or B2912A Precision Source/Measure Unit is a (a) Physical connection of the LIV test using the B2900A Series of SMUs. compact and cost-effective bench-top Source/Measure Unit (SMU) with the IL Ip capability to output and measure both DUT Detector voltage and current. It covers currents from 10 fA to 3 A (DC)/10.5 A (pulse) LD PD and voltages from 100 nV to 210 V, V VL Vp which enables you to make a wide A range of current versus voltage (IV) measurements more accurately and quickly than ever before. In addition, the B2900A Series of SMUs comes CH1 CH2 with an intuitive graphical user I sweep/V measure V force/I measure interface (GUI) and free PC-based (b) Operating mode of each channel for the LIV test. application software that make it easy for you to begin making productive Figure 1. Using the B2900A Series of SMUs to perform the LIV test of laser diodes measuremen