Agilent 5988-9215EN English 2014-08-01 PDF 987 KB c20141022 [43] free download

File name 5988-9215EN English _ 2014-08-01 _ PDF 987 KB c20141022 [43].pdf

Keysight Technologies Fundamentals of RF and Microwave Power Measurements (Part 3) Application Note For user convenience, the Keysight Fundamentals of RF and Microwave Power Fundamentals of RF and Microwave Power Measurements, applica- Measurements (Part 1) tion note 64-1, literature number Introduction to Power, History, Deinitions, International 5965-6330E, has been updated and Standards, and Traceability segmented into four technical subject AN 1449-1, literature number 5988-9213EN groupings. The following abstracts Part 1 introduces the historical basis for power measurements, and provides explain how the total field of power definitions for average, peak, and complex modulations. This application note measurement fundamentals is now overviews various sensor technologies needed for the diversity of test signals. It presented. describes the hierarchy of international power traceability, yielding comparison to national standards at worldwide National Measurement Institutes (NMIs) like the U.S. National Institute of Standards and Technology. Finally, the theory and practice of power sensor comparison procedures are examined with regard to transferring calibration factors and uncertainties. A glossary is included which serves all four parts. Fundamentals of RF and Microwave Power Measurements (Part 2) Power Sensors and Instrumentation AN 1449-2, literature number 5988-9214EN Part 2 presents all the viable sensor technologies required to exploit the users' wide range of unknown modulations and signals under test. It explains the sensor technologies, and how they came to be to meet certain measurement needs. Sen- sor choices range from the venerable thermistor to the innovative thermocouple to more recent improvements in diode sensors. In particular, clever variations of diode combinations are presented, which achieve ultra-wide dynamic range and square-law detection for complex modulations. New instrumentation technologies, which are underpinned with powerful computational processors, achieve new data