Agilent LED Production Test Using the Keysight B2911A 5990-7140EN c20130107 [5] free download

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LED Production Test Using the Agilent B2900A Series of SMUs Technical Overview Agilent B2901/02/11/12A Precision Source/Measure Unit Agilent B2901A Precision SMU, 1ch, 100 fA resolution, 210 V, 3 A DC/10.5 A pulse Agilent B2902A Precision SMU, 2ch, 100 fA resolution, 210 V, 3 A DC/10.5 A pulse Agilent B2911A Precision SMU, 1ch, 10 fA resolution, 210 V, 3 A DC/10.5 A pulse Agilent B2912A Precision SMU. 2ch, 10 fA resolution, 210 V, 3 A DC/10.5 A pulse Introduction both voltage and current. They cover currents from 10 fA to 3 A (DC)/10.5 A Numerous emerging light emitting (pulse) and voltages from 100 nV to diode (LED) applications have created 210 V. In addition to these compre- a demand for LEDs with higher quality hensive measurement capabilities, and reliability. Testing that is both the B2900A Series of SMUs pos- more accurate and faster and that sesses high throughput that reduces permits quicker sorting is therefore test times. The B2900A Series of required for both on-wafer devices SMUs also has many features that during fabrication and for packaged make it well-adapted for production devices during final test. test, such as pass/fail binning, a digital I/O interface for handler Both electrical and optical tests are control, and code compatibility with typically performed on LEDs. The standard single and dual channel Agilent B2901/02/11/12A Precision SMU products. Source/Measure Unit is the best solution for all electric tests such as This technical overview focuses on a forward voltage test (VF), a leakage the electrical testing of LEDs in pro- current test (IR) and a breakdown duction. If you need to perform optical voltage test (VBR). In addition, it can tests in addition to electric tests, then be used to provide forward current dual-channel models of the B2900A bias during optical test. Series of SMUs can be used. The dual-channel models of the B2900A The B2900A Series of SMUs is a Series of SMUs permit one channel compact and cost-effective benchtop to measure photo diode current while Source/Measure Unit (SMU) with the other channel drives the LED. the capability to source and measure Easy production test Program memory For tests that utilize lots of repeated code (such as subroutines), program system configuration improves throughput memory can dramatically reduce test Figure 1 shows a conceptual diagram Fast test times are essential to times. Of course, programs can be of a system based on the B2900A maximiz