Keithley 2547 Sequential to Parallel free download

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A G R E AT E R M E A S U R E O F C O N F I D E N C E dler, which bins the part and places another in the fixture. Sequential test is appropriate when the component handler costs less than the test equipment. In the multiplex test method (Figure 2) the component handler puts multiple compo- nents in the test fixture at once, and the test equipment includes a multiplexer to switch between devices. This increases through- put--especially if the component handler can move all components simultaneously, as with tape-and-reel systems or wafer prober Choosing a strategy systems with a multi-site probe card. This method is appropriate when the test sequence is short compared to the time required to in- for component test dex to the next set of test sites on the wafer or position the next set of DUTs in the fixture. automation Parallel and concurrent Adding multiple test sets allows parallel test, with all components tested at the same